1
Robert S Sposili, Nestor O Farmiga, Kanti Jain: High-throughput materials processing system. Anvik Corporation, Carl C Kling, June 10, 2003: US06577380 (75 worldwide citation)

A materials-processing system based on projection irradiation using a pulsed-laser source is disclosed. The salient features include a novel illumination system containing a homogenizer that produces a self-luminous light beam of selected cross-section, spatially uniform intensity, and selected nume ...


2
Kanti Jain, Nestor O Farmiga: High-speed maskless via generation system. Anvik Corporation, Carl C Kling, February 4, 2003: US06515257 (51 worldwide citation)

High-performance microelectronic modules, such as chip-scale packages, flip-chip modules, integrated micro-opto-electronic boards, fine-line printed circuits, and system-on-a-package modules, span a range of sizes and interconnect densities. Current technologies for via generation are not optimized ...


3
Thomas J Dunn, Nestor O Farmiga, Marc Zemel, Carl Weisbecker, Kanti Jain: Very large area patterning system for flexible substrates. Anvik Corporation, Carl C Kling, January 25, 2000: US06018383 (38 worldwide citation)

In the manufacturing of flexible, large-area electronic modules such as flat-panel displays (FPDs), the high cost and low yields of currently available patterning equipment represent a significant barrier to cost-effective production. This invention provides a projection imaging system that can patt ...


4
Marc A Klosner, Marc I Zemel, Kanti Jain, Nestor O Farmiga: Projection lithography on curved substrates. Anvik Corporation, Carl C Kling, July 9, 2002: US06416908 (25 worldwide citation)

A microlithography system, capable of performing high resolution imaging on large-area curved surfaces, based on projection lithography. The system utilizes a high-resolution lens to image a curved mask directly onto a curved substrate. The system uses a curved mask which is identical in shape to th ...


5
Kanti Jain, Thomas J Dunn, Nestor O Farmiga, Carl Weisbecker, Carl C Kling: High-speed drilling system for micro-via pattern formation, and resulting structure. Carl C Kling, March 21, 2000: US06040552 (21 worldwide citation)

Economical production of laser-drilled high-precision, ultra-miniature multiple-via-hole patterns is accomplished by multiplexing the homogenized, shaped, nearly-collimated output of a high-power excimer laser into a modular set of condenser lens/mask/projection lens beamlines. A substrate delivery ...


6
Nestor O Farmiga: Optical beam-shaper-uniformizer construction. Anvik Corporation, Carl C Kling, October 27, 1998: US05828505 (17 worldwide citation)

An internally-mirrored tube of constant cross-section, for use as a beam-shaper-uniformizer in an optical lithography tool, requires precision assembly, closely approaching total internal reflection, to be able to accept at the entry end a beam of laser light of specified numerical aperture, having ...


7
Thomas J Dunn, Nestor O Farmiga, Kanti Jain: Projection patterning of large substrates using limited-travel x-y stage. Anvik Corporation, Carl C Kling, April 27, 1999: US05897986 (16 worldwide citation)

A large-format substrate patterning system, for microelectronics manufacturing, utilizes a substrate docking fixture to enable relative motion between the substrate stage and the substrate. This enables exposure of a large-format substrate which has been partitioned into different modules where each ...


8
Nestor O Farmiga, Kanti Jain: Three-dimensional universal mounting component system for optical breadboards. Anvik Corporation, Carl C Kling, October 20, 1998: US05825558 (12 worldwide citation)

A three-dimensional Universal Mounting Component (UMC) system of UMC blocks provides general mounting for use in optical research in constructing layouts for experiments and breadboard-type prototypes. In such optical layouts laser beams or other light beams are directed about complex paths, often o ...


9
Eric L Buckland, Andrew Murnan, Christopher Saxer, Robert H Hart, Nestor O Farmiga: Optical systems for whole eye imaging and biometry. Bioptigen, Myers Bigel Sibley & Sajovec, September 1, 2015: US09119563 (5 worldwide citation)

Scanning optical beam imaging systems for imaging extended structures of an eye and providing biometry of an eye are provided. The systems include a focal system for shifting the focus of the scanning system from the front to the back of the eye. The systems provide for converging rays that can scan ...


10
Eric L Buckland, Nestor O Farmiga, Robert H Hart, Andrew Murnan, Christopher Saxer: Surgical microscopes using optical coherence tomography and related methods. Bioptigen, Myers Bigel Sibley & Sajovec, July 15, 2014: US08777412 (5 worldwide citation)

Some embodiments of the present inventive concept provide optical coherence tomography (OCT) systems for integration with a microscope. The OCT system includes a sample arm coupled to the imaging path of a microscope. The sample arm includes an input beam zoom assembly including at least two movable ...