1
Mark W Klug, Thomas E Toth, Theodore C Guenther, Martin Twite, Kazuyuki Tsurishima, Mitsuaki Tani, Minoru Baba, Teruaki Sakurada: Apparatus for automatic handling. Advantest Corporation, Knobbe Martens Olson & Bear, May 17, 1994: US05313156 (75 worldwide citation)

An integrated circuit (IC) device test handler which is adaptable to receive various customer tray configurations and automatically test the ICs within. The test handler comprises a customer tray magazine input area, a load section, a soak chamber, a test section, an unsoak chamber and an unload are ...


2
Minoru Baba: Pick and place for automatic test handler. Advantest Corporation, Knobbe Martens Olson & Bear, March 1, 1994: US05290134 (61 worldwide citation)

A pick and plate apparatus for use in an automatic test handler picks up electronic devices from one type of tray, transfer the electronic devices in a horizontal plane to another type of tray, and places the electronic devices in a predetermined position on the other tray for testing and sorting. T ...


3
Kazuyuki Tsurishima, Minoru Baba, Teruaki Sakurada, Theodore C Guenther: Contact assembly for automatic test handler. Sym Tek Systems, Advantest, Knobbe Martens Olson & Bear, July 13, 1993: US05227717 (52 worldwide citation)

A contact assembly for use in testing electronic devices such as integrated circuits (IC's) and the like. The contact assembly has a test fixture having a test contactor, a corresponding carrier module aligned on a test tray for positioning the electronic devices to be tested in alignment with the t ...