1
Leonard Hayden, Scott Rumbaugh, Mike Andrews: Probe for combined signals. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 20, 2004: US06724205 (98 worldwide citation)

A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test th ...


2
Leonard Hayden, Scott Rumbaugh, Mike Andrews: Probe for combined signals. Cascaded Microtech, Oyen Wiggs Green & Mutala, October 19, 2004: US06806724 (95 worldwide citation)

A direct current and a modulation signal are simultaneously applied to contact pads on a wafer to test certain devices, such as a laser diode. A probe, probing system, and method of probing reduces signal distortion and power dissipation by transmitting a modulated signal to the device-under-test th ...


3
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 9, 2004: US06815963 (65 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


4
Mike Andrews, Paul Litchfield, Jorgen Romer, Ricardo Vestuti: Lightweight sole for article of footwear. Reebok International, Sterne Kessler Goldstein & Fox P L L C, September 21, 2010: US07797856 (60 worldwide citation)

A sole for an article of footwear comprising a midsole having a plurality of polygonal-shaped openings, or cavities, therein. In alternative embodiments, the sole includes reinforcement elements such as a plate disposed along at least a portion of one of the surfaces of the midsole. The plate includ ...


5
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 18, 2007: US07271603 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path extending between the first and second surfaces of a membrane and a p ...


6
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 9, 2007: US07161363 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


7
Derek T Cheung, A Mike Andrews II, Joseph T Longo: Self-multiplexed monolithic intrinsic infrared detector. Rockwell International Corporation, H Frederick Hamann, Craig O Malin, March 17, 1981: US04257057 (29 worldwide citation)

In this monolithic detector array, a signal processing layer is epitaxially formed directly on an active detector layer. The active detector layer is supported by a transparent substrate. The three layers are made of intrinsic semiconductors of the same conductivity type (e.g., n-type). The semicond ...


8
Leonard Hayden, John Martin, Mike Andrews: Wafer probe. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, June 19, 2007: US07233160 (25 worldwide citation)

The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.


9
K Reed Gleason, Tim Lesher, Mike Andrews, John Martin: Shielded probe for testing a device under test. Sharp Laboratories of America, Chernoff Vilhauer McClung & Stenzel, June 6, 2006: US07057404 (22 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact ...


10
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for high-frequency testing of a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 4, 2007: US07304488 (11 worldwide citation)

A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a sec ...