1
Michel Delhaye, Yves J M Moschetto, Paul Dhamelincourt: Apparatus for the non-destructive examination of heterogeneous samples. Institut National de la Sante et de la Recherche Medicale, Robert B Frailey, June 21, 1977: US04030827 (159 worldwide citation)

The present invention relates to an apparatus for the non-destructive examination of an heterogeneous sample by analysis of the Raman radiations scattered by the sample receiving an incident of monochromatic radiation of known frequency. The apparatus includes a source of monochromatic light, such a ...


2
Michel Delhaye, Andre Deffontaine, Andre Chapput, Michel Bridoux, Edouard Da Silva: Method of discrimination in spectrometry. Robert E Burns, Emmanuel J Lobato, Bruce L Adams, July 7, 1987: US04678277 (109 worldwide citation)

The invention relates to a method of discrimination in spectrometry, particularly of eliminating phenomena of fluorescence in Raman spectrometry. According to the invention, a sample (6) is excited by a luminous pulse (5) generated from a laser (1). The light (7) emitted by the sample (6) is directe ...


3
Michel Delhaye, Edouard Da Silva, Gerard Martinez: Spectral-band filtration spectrometry apparatus. Dilor, Dennison Meserole Pollack & Scheiner, June 13, 1995: US05424825 (12 worldwide citation)

The filtration means filter the exciter radiation (EX) in a first forward direction from generator means (LS) to the specimen (EC), by allowing a second spectral band (BZ) of predetermined spectral width (l) and centered on a selected frequency corresponding to the wavelength of the exciter radiatio ...


4
Edouard Da Silva, Michel Delhaye, Jacques Barbillat: Combined complementary filtering spectrum analysis device, in particular for RAMAN spectrometry. Dilor, Spencer & Frank, August 26, 1997: US05661557 (9 worldwide citation)

A sample which is exposed to excitation radiation scatters light to a separator filter. The scattered light includes a Raman spectrum. The separator filter reflects, a spectral band of the radiation which it receives and transmits, the remainder of the radiation which it receives. The reflected spec ...


5
Michel Delhaye, Jacques Barbillat, Edouard Da Silva: Spectrometry apparatus. Dilor, Dennison Meserole Pollack & Scheiner, October 13, 1998: US05822061 (7 worldwide citation)

The spectrometry apparatus of the present invention includes, in addition to conventional analysis, a first diaphragm having a first chosen variable aperture for spatially filtering a coherent-excitation beam. The apparatus also includes a first deflector stage (DF1) for sweeping an excitation beam ...


6
Edouard Da Silva, Michel DelHaye, Michel Leclercq, Bernard Roussel: Spectrometric imaging apparatus. Jobin Yvon, Arent Fox PLLC, September 27, 2005: US06950185 (7 worldwide citation)

An inelastic diffusion spectrometric imaging apparatus includes an illuminating and energising system including a confocal first aperture and a second confocal aperture combined with the first. A first deflector assembly scanning for scanning a sample and a second deflector assembly sychronised with ...


7
Michel Delhaye, Edouard Da Silva, Bernard Roussel: Dispersive spectrometry installation with multi-channel detection. Dilor, Dennison Meserole Pollack & Scheiner, November 17, 1992: US05164786 (6 worldwide citation)

The invention relates to a spectrometry installation comprising an inlet, optical fiber means suitable for receiving an inlet beam and delivering a spectrally dispersed image of the beam which image is limited to a selected spectral band, a multi-channel detection module receiving said spectral imag ...


8
Edouard Da Silva, Michel Delhaye, Michel Leclercq, Bernard Roussel: Process and device for optimizing the position and the width of the cut-off band of an optical filtering device. Dilor, Jeffrey H Ingerman, Brett G Alten, Fish & Neave, September 21, 1999: US05956136 (2 worldwide citation)

In an optical fittering device comprising at least two fitters, the first filter (EF1) is tilted by an angle of incidence whose value is adjusted to bring the cut-off limit of the first filter (EF1) closer to one of the sides of the line of the illumination beam (FLA), which reduces the optical dens ...


9
Edouard Da Silva, Michel Delhaye: Global spectral image analysing system for emission type optical and raman diffusion or fluorescence spectrometer. Dilor, October 27, 1995: FR2719114-A1

The system includes a primary monochromatic beam (6), a radiating source (4), a sample to be analysed (8), an illuminating means (12) designed so that the primary radiation (16) globally illuminates a chosen zone of the sample to be analysed. The system has an optical filtering unit (22,28) to recei ...


10
Michel Delhaye, Edouard Da Silva: Spectroscopic apparatus.. Dilor, September 11, 1992: FR2673718-A1

The spectrometry apparatus comprises in addition to the conventional analysis means: - a first diaphragm (MD1) comprising a first variable aperture (D1) chosen in order to spatially filter the coherent excitation beam (FE); - a first deflector stage (DF1) for sweeping the excitation beam over the sa ...