1
Joseph A Lebel, Charles D Albrecht, Kar Kui Mark, Michael Ugenti: Software reconfigurable instrument with programmable counter modules reconfigurable as a counter/timer, function generator and digitizer. Grumman Aerospace Corporation, Scully Scott Murphy & Presser, January 14, 1992: US05081297 (30 worldwide citation)

A reconfigurable signal processing device that includes a plurality of programmable modules that are reconfigurable to perform one of a plurality of selected signal processing functions. The modules may be reconfigured under software control to act as one of a time base generator, a counter, an accu ...


2
Michael Ugenti: Digital receiver with dual references. Grumman Aerospace Corporation, Pollock VandeSande & Priddy, May 17, 1988: US04745365 (14 worldwide citation)

A pair of comparators is provided with attenuated input signals. Each comparator is provided with a different reference level so that two sets of complementary digital outputs may be obtained with different pulse widths. Hysteresis control is provided to the comparators to compensate for noise prese ...


3
Michael Ugenti: Computer-aided, logic pulsing probe for locating faulty circuits on a printed circuit card. Grumman Aerospace Corporation, Richard G Geib, Daniel J Tick, Bernard S Hoffman, June 6, 1989: US04837502 (13 worldwide citation)

A system is described for locating faulty integrated circuits on a printed circuit card under the guidance of computer programmed in accordance with the circuit being tested. The disclosed system includes a current pulsing network allowing digital selection, as by the computer, of reference voltage ...


4
Joseph A Langone, Michael Ugenti: Tri-state circuit tester. Grumman Aerospace Corporation, Pollock VandeSande & Priddy, May 10, 1988: US04743842 (8 worldwide citation)

A testing circuit is capable of testing digital circuits, such as gates, in logic 1, logic 0 and Hi-Z conditions. To accomplish this end two comparators are connected to the output of the digital circuit undergoing test while second inputs of both comparators are respectively connected to different ...


5
Michael Ugenti, Richard Caiola: Computer-aided probe with tri-state circuitry test capability. Grumman Aerospace Corporation, Pollock VandeSande & Priddy, October 18, 1988: US04779042 (3 worldwide citation)

A probe is connected to a tri-state circuit which generates a programmable dc voltage to be impressed on a circuit node by the probed tip. Memory is provided for storing any change in tip voltage signifying a fault in the tri-state test. A separate circuit detects programmable data levels to elimina ...


6
Michael Ugenti: Digital receiver with dual references. Grumman Aeropspace, New York 11714, U, XU XINGEN CAO JIHONG, July 13, 1988: CN87108294

A pair of comparators is provided with attenuated input signals. Each comparator is provided with a different reference level so that two sets of complementary digital outputs may be obtained with different pulse widths. Hysteresis control is provided to the comparators to compensate for noise prese ...


7
Michael Ugenti: Computer-aided probe with tri-state circuitry test capability. Grumman Aerospace, WU ZENGYONG KUANG SHAOBO, July 6, 1988: CN87108371

A probe is connected to a tri-state circuit which generates a programmable dc voltage to be impressed on a circuit node by the probed tip. Memory is provided for storing any change in tip voltage signifying a fault in the tri-state test. A separate circuit detects programmable data levels to elimina ...