1
Torsten Jahnke, Michael Richard Haggerty: Method for the operation of a measurement system with a scanning probe microscope and a measurement system. JPK Instruments, Schmeiser Olsen & Watts, February 5, 2013: US08368017 (1 worldwide citation)

The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the meth ...


2
Torsten Jahnke, Michael Richard Haggerty: Method for the Operation of a Measurement System With a Scanning Probe Microscope and a Measurement System. Schmeiser Olsen & Watts, December 18, 2008: US20080308726-A1

The invention relates to a method for operating a measurement system containing a scanning probe microscope, in particular an atomic force microscope, and to a measurement system for examining a measurement sample using a scanning probe microscope and for optically examining said sample. In the meth ...