1
Donald A Bradley, Martin I Grace, Douglas R Thornton, David P Finch: Apparatus and method for measuring the phase and magnitude of microwave signals. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, June 4, 1996: US05524281 (140 worldwide citation)

A measurement system is provided which comprises: source circuit for receiving feedback signals and for providing respective signals at respective discrete frequencies in a prescribed microwave frequency range, wherein the respective provided signals at respective discrete frequencies are substantia ...


2
Martin I Grace, Peter M Kapetanic, Eric C Liu: Method and apparatus for increasing the high frequency sensitivity response of a sampler frequency converter. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, May 12, 1992: US05113094 (100 worldwide citation)

A method and apparatus comprising a sampler frequency converter having a first and a second diode. A local oscillator having a frequency F.sub.LO, a step recovery diode and a balun transformer are used for providing positive and negative sampling pulses to the diodes for sampling an input signal app ...


3
Martin I Grace, William W Oldfield: Wafer probe with built in RF frequency conversion module. Anritsu Company, Fliesler Dubb Meyer & Lovejoy, January 2, 2001: US06169410 (84 worldwide citation)

A wafer probe with built in components to perform frequency multiplication, upconversion, downconversion, and mixing typically performed by an RF module of a vector network analyzer (VNA). The wafer probe is designed for testing integrated circuits used in collision avoidance radar systems and opera ...


4
Martin I Grace, William W Oldfield: Internal automatic calibrator for vector network analyzers. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, August 20, 1996: US05548538 (37 worldwide citation)

A calibration technique for a vector network analyzer (VNA) enabling calibration standards to be included internal to the VNA. To calibrate the VNA utilizing the internal calibration standards, error terms a, b and c of two two-port error boxes E are defined between the measurement ports and the ref ...


5
Martin I Grace, Ramzi Abou Jaoude, Karam Noujeim: Automotive radar antenna alignment system. Anritsu Company, Fliesler Dubb Meyer & Lovejoy, January 1, 2002: US06335705 (25 worldwide citation)

Two receive antennas integrated with power detectors are used to align the thrust vector of a vehicle to the boresite of an automotive radar antenna mounted upon the vehicle. In the system, a signal is transmitted from the radar antenna to the Radar Test System (RTS) positioned as an amplitude only ...


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Martin I Grace, William W Oldfield: Internal automatic calibrator for vector network analyzers. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, February 3, 1998: US05715183 (19 worldwide citation)

A calibration technique for a vector network analyzer (VNA) enabling calibration standards to be included internal to the VNA. To calibrate the VNA utilizing the internal calibration standards, error terms a, b and c of two two-port error boxes E are defined between the measurement ports and the ref ...


8
Martin I Grace, Donald A Bradley: Universal autoradar antenna alignment system. Anritsu Company, Fliesler Dubb Meyer & Lovejoy, July 11, 2000: US06087995 (18 worldwide citation)

An automobile collision avoidance radar antenna alignment system includes a first interferometer (506) with antennas (501) and (503) for alignment along an azimuth (x) axis of the collision avoidance radar antenna, and a second interferometer (508) with antennas (502) and (504) for alignment along a ...


9
Martin I Grace, Donald A Bradley, James N Liu: Measuring noise figure and y-factor. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, March 2, 1993: US05191294 (16 worldwide citation)

Apparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise mo ...


10
Martin I Grace, Richard E Simmons: Multiple YIG oscillator. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, May 19, 1992: US05115209 (11 worldwide citation)

YIG oscillator apparatus comprises both an FET-based YIG oscillator circuit and a bipolar transistor-based YIG oscillator circuit inside a single magnetic structure. Both YIG spheres are disposed in the single air gap of the magnetic structure, which is defined by a pole piece which is tapered to an ...