1
David Chih, Lee K Lau, Keith S K Lee: Method and apparatus for a multi-chip module that is testable and reconfigurable based on testing results. ATI International, Vedder Price Kaufman & Kammholz, February 26, 2002: US06351681 (32 worldwide citation)

A method and apparatus for a multi-chip module that is testable and reconfigurable based on testing results is accomplished by a multi-chip module that includes a first circuit disposed on a first chip substrate, a second circuit disposed on second chip substrate, and an interconnecting substrate op ...


2
Lee K Lau, Robert P Bicevskis: Method and apparatus for an integrated circuit that is reconfigurable based on testing results. ATI International, Markison & Reckamp P C, September 21, 1999: US05956252 (18 worldwide citation)

A method and apparatus for reconfiguring an integrated circuit based on testing results is accomplished by an integrated circuit that includes a first circuit, a second circuit, and configuration circuitry deposited on a single die. After testing of the die, the configuration circuitry configures th ...


3
Lee K Lau: Method and apparatus for extending memory of an integrated circuit. ATI Technologies, Markison & Reckamp P C, March 27, 2001: US06209075 (12 worldwide citation)

A method and apparatus for extending an on-chip processing device's access to memory are accomplished by depositing a processing circuit, memory, and configuration circuitry on a die. When the memory has sufficient digital storage capabilities for the processing circuit, the configuration circu ...