1
Toshihiro Yonezawa, Kunio Sano, Takashi Sato: Apparatus for aligning a semiconductor wafer with an inspection contactor. Tokyo Electron, Oblon Spivak McClelland Maier & Neustadt P C, December 7, 1999: US05999268 (118 worldwide citation)

An aligning apparatus includes a first image pickup camera for picking up an image of an inspection contactor, a moving body located so as to be movable in X-, Y-, Z- and .theta.-directions and having the first image pickup camera fixed thereon, a wafer bearer capable of being located on the moving ...


2
Kunio Sano: Probe device. Tokyo Electron Kabushiki Kaisha, Tokyo Electron Yamanashi Kabushiki Kaisha, Beveridge DeGrandi Weilacher & Young L, August 27, 1996: US05550482 (97 worldwide citation)

A probe device for testing a wafer divided into IC chips has a vessel that accommodates a wafer mounting stand and a flexible probe card having contactor bumps. The vessel is configured in a separatable manner of a grounded aluminum cover portion to which the probe card is integrally fixed and a bas ...


3
Kiichiro Mitsui, Sadao Terui, Kunio Sano, Toshihide Kanzaki, Kazuyoshi Nishikawa, Akira Inoue: Method for treatment of waste water. Nippon Shokubai Kagaku Kogyo, Omri M Behr, June 14, 1988: US04751005 (46 worldwide citation)

Efficient treatment of waste water is accomplished by subjecting the waste water to wet oxidation under continued supply of an oxygen containing gas at a temperature of not more than 370.degree. C. under a pressure enough for the waste water to retain the liquid phase thereof intact, in the presence ...


4
Kunio Sano: Probe apparatus. Tokyo Electron, Tokyo Electron Yamanashi, Oblon Spivak McClelland Maier & Neustadt P C, February 18, 1997: US05604446 (41 worldwide citation)

The probe apparatus for a semiconductor wafer has a work table on which a wafer is placed. A printed wiring board having a high rigidity is situated above the work table. A flexible membrane probe card is detachably mounted on the printed wiring board. The probe card has a main region in which conta ...


5
Kiichiro Mitsui, Tooru Ishii, Sadao Terui, Kunio Sano, Akira Inoue: Catalyst for water treatment. Nippon Shokubai Kagaku Kogyo, Burns Doane Swecker & Mathis, March 9, 1993: US05192452 (34 worldwide citation)

This invention relates to a catalyst for use in water treatment and to a method for the water treatment by the use of the catalyst. The catalyst comprises a first catalyst component e.g. the oxide of titanium, silicon, aluminum and zirconium, and a second catalyst component e.g. manganese, iron, cob ...


6
Kunio Sano: Probing method and device. Tokyo Electron Kabushiki Kaisha, Tokyo Electron Yamanashi Kabushiki Kaisha, Beveridge Degrandi Weilacher & Young, September 24, 1996: US05559446 (30 worldwide citation)

A probing device for inspecting semiconductor devices such as IC chips includes a mounting section for supporting a silicon substrate wafer (i.e., an object to be inspected), a moving section for moving a probe card in such a way that contacts formed on a surface of the probe card can be pushed agai ...


7
Tooru Ishii, Kiichiro Mitsui, Kunio Sano, Akira Inoue: Method for treatment of waste water. Nippon Shokubai Kagaku Kogyo, Burns Doane Swecker & Mathis, September 8, 1992: US05145587 (28 worldwide citation)

A method for the treatment of waste water, which comprises wet oxidizing said waste water with a molecular oxygen-containing gas of an amount 1.0 to 1.5 times the amount thereof theoretically necessary for decomposing at least one substance selected from the group consisting of organic substances an ...


8
Motonobu Kobayashi, Kiichiro Mitsui, Yoku Nanba, Toshihide Kanzaki, Kunio Sano, Takehiko Suzuki, Akira Inoue: Method for purification of gas. Nippon Shokubai Kagaku Kogyo, Omri M Behr, September 8, 1992: US05145657 (28 worldwide citation)

A catalyst for the purification of a gas containing ozone or a component of offensive odor is composed of (A) a composite oxide comprising (a) titanium and (b) at least one element selected from the group consisting of Si, Zr, and P and (B) at least one element selected from the group consisting of ...


9
Kunio Sano: Probing test apparatus. Tokyo Electron, Oblon Spivak McClelland Maier & Neustadt P C, December 30, 1997: US05703494 (27 worldwide citation)

A probing test apparatus comprising a probe card having a plurality of probes and first terminals contacted with and electrically connected to conductive pads of a circuit, a test head having a signal transmitting circuit through which the test signal is transmitted to the probes, a performance boar ...


10
Yoshinori Imoto, Katsunosuke Hara, Masakatsu Hiraoka, Kunio Sano, Akira Inoue: Method of treating exhaust gas. NGK Insulators, Masakatsu Hiraoka, Nippon Shokubai Kagaku Kogyo, Parkhurst Wendel & Rossi, October 19, 1993: US05254797 (23 worldwide citation)

A catalyst composition including component A and component B, the component A being a carrier, preferably having a honeycomb structure, and being a single-component oxide or a multi-component composite oxide of at least one metal of titanium, silicon and zirconium, and the component B being a cataly ...