1
Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka: Time domain network analyzer. Teledyne LeCroy, Andrew Dommer, June 14, 2016: US09366743 (72 worldwide citation)

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


2
Peter J Pupalaikis, Kaviyesh Doshi: Method for de-embedding device measurements. Teledyne LeCroy, Gordon Kessler, October 22, 2013: US08566058 (72 worldwide citation)

A method is provided for de-embedding measurements from a given network containing mixtures of devices with known and unknown S-parameters given a description of the network and the known S-parameters of the overall system.


3
Peter J Pupalaikis, Kaviyesh Doshi: Method and apparatus for correction of time interleaved ADCs. Teledyne LeCroy, Gordon Kessler, January 5, 2016: US09231608 (1 worldwide citation)

A method and apparatus is provided for on-the-fly calibration of and correction for time interleave error, including generation of correction data associated with an interleave corrector employed by a system for converting a time-domain input stream, corresponding to samples acquired from an interle ...


4
Peter J Pupalaikis, Kaviyesh Doshi: Method for printed circuit board trace characterization. Teledyne LeCroy, Gordon Kessler, February 25, 2014: US08659315 (1 worldwide citation)

A method is provided which measures PCB trace characteristics from measurements of a PCB trace structure.


5
Peter J Pupalaikis, Kaviyesh Doshi, Roger Delbue, Anirudh Sureka: Time domain network analyzer. Teledyne LeCroy, Gordon Kessler, April 22, 2014: US08706438

An apparatus for measuring s-parameters using as few as one pulser and two samplers is described. The apparatus calibrates itself automatically using the internal calibration standards.


6
Peter J Pupalaikis, Anirudh Sureka, Kaviyesh Doshi: Wavelet denoising for time-domain network analysis. Teledyne LeCroy, Gordon Kessler, September 23, 2014: US08843335

A method and apparatus are provided for the removal of significant broad-band noise from waveforms acquired for time domain network analysis. The method may include the steps of providing the noisy waveform as an input waveform, determining a frequency domain noise shape associated with the input wa ...


7
Peter J Pupalaikis, Kaviyesh Doshi, Anirudh Sureka: Time domain reflectometry step to S-parameter conversion. Teledyne LeCroy, Gordon Kessler, April 22, 2014: US08706433

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.


8
Peter J Pupalaikis, Kaviyesh Doshi: Method for De-embedding Device Measurements. LeCroy Corporation, Lecroy Corporation, October 7, 2010: US20100256955-A1

A method is provided for de-embedding measurements from a given network containing mixtures of devices with known and unknown S-parameters given a description of the network and the known S-parameters of the overall system.


9
Peter J Pupalaikis, Kaviyesh Doshi, Anirudh Sureka: Time domain reflectometry step to s-parameter conversion. LeCroy Corporation, August 4, 2011: US20110191046-A1

A method and apparatus are provided for calculating s-parameters of a device under test from step waveforms acquired by a time domain network analyzer.


10
Peter J Pupalaikis, Anirudh Sureka, Kaviyesh Doshi: Wavelet Denoising for Time-Domain Network Analysis. LeCroy Corporation, August 4, 2011: US20110191047-A1

A method and apparatus are provided for the removal of significant broadband noise from waveforms acquired for time domain network analysis.