1
K Reed Gleason, Keith E Jones, Eric W Strid: Microwave wafer probe having replaceable probe tip. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 18, 1989: US04849689 (128 worldwide citation)

A microwave wafer probe having a replaceable planar transmission line probe tip which detachably connects to a planar transmission line circuit board within the probe head. The circuit board may include passive and/or active electrical circuit components interconnecting its conductors which, due to ...


2
K Reed Gleason, Kenneth R Smith, Mike Bayne: Membrane probing system with local contact scrub. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, June 22, 1999: US05914613 (118 worldwide citation)

A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lin ...


3
K Reed Gleason, Keith E Jones: High-frequency active probe having replaceable contact needles. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 3, 1991: US05045781 (111 worldwide citation)

A high-frequency probe comprising a semirigid coaxial line which terminates in an active circuit assembly. The coaxial line's outer conductor is connected to a box while its inner conductor is connected to an active circuit chip. A signal contact needle is attached to the active circuit chip and ext ...


4
Eric W Strid, Jerry B Schappacher, Dale E Carlton, K Reed Gleason: System for evaluating probing networks. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 1, 1996: US05561377 (65 worldwide citation)

An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the refere ...


5
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 9, 2004: US06815963 (65 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


6
Eric W Strid, Jerry B Schappacher, Dale E Carlton, K Reed Gleason: Method of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channels. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, August 19, 1997: US05659255 (56 worldwide citation)

A method of evaluating the signal conditions in a probe measurement network of the type having a plurality of separate measurement channels, where each channel communicates through a corresponding device-probing end. The method includes providing an assembly which includes a conductive planar probin ...


7
Eric W Strid, Jerry B Schappacher, Dale E Carlton, K Reed Gleason: Reference transmission line junction for probing device. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, August 19, 2003: US06608496 (55 worldwide citation)

An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the refere ...


8
Eric W Strid, Jerry B Schappacher, Dale E Carlton, K Reed Gleason: System for evaluating probing networks that have multiple probing ends. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, February 9, 1999: US05869975 (54 worldwide citation)

An interconnect assembly for evaluating a probe measurement network includes a base, respective first, second and third device-probing areas arranged on an upper face of the base in spaced-apart relation so that first, second and third device-probing ends belonging to the measurement network can be ...


9
Eric W Strid, Jerry B Schappacher, Dale E Carlton, K Reed Gleason: System for evaluating probing networks. Cascade Microtech, Kevin L Chernoff Vilhauer McClung & Stenzel Russell, October 26, 1999: US05973505 (53 worldwide citation)

An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the refere ...


10
Eric W Strid, Jerry B Schappacher, Dale E Carlton, K Reed Gleason: System for evaluating probing networks. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 10, 2000: US06130544 (48 worldwide citation)

An interconnect assembly for evaluating a probe measurement network includes a base, respective inner and outer probing areas in mutually coplanar relationship on the upper face of the base, a reference junction, and a high-frequency transmission structure connecting the probing areas and the refere ...