1
Clarence E Cowan, Paul A Tervo, John L Dunklee: Probe station thermal chuck with shielding for capacitive current. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 3, 2002: US06445202 (48 worldwide citation)

The chuck of a probe station is shielded from capacitive currents generated by fluctuation of the power to the thermal unit of a thermal chuck. The thermal chuck includes a chuck for supporting a device under test; a thermal unit for modifying the temperature of the chuck and a conductive member cap ...


2
Clarence E Cowan, Paul A Tervo, John L Dunklee: Probe station thermal chuck with shielding for capacitive current. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 4, 2003: US06642732 (48 worldwide citation)

To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to ...


3
Clarence E Cowan, Paul A Tervo, John L Dunklee: Probe station thermal chuck with shielding for capacitive current. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 28, 2003: US06512391 (16 worldwide citation)

To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to ...


4
Clarence E Cowan, Paul A Tervo, John L Dunklee: Probe station thermal chuck with shielding for capacitive current. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 21, 2006: US07138813 (14 worldwide citation)

To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to ...


5
Clarence E Cowan, Paul A Tervo, John L Dunklee: Probe station thermal chuck with shielding for capacitive current. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 6, 2007: US07292057 (3 worldwide citation)

To reduce noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conductive member is capacitively coupled to ...


6
Clarence E Cowan, Paul A Tervo, John L Dunklee: Probe station thermal chuck with shielding for capacitive current. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 10, 2009: US07616017 (2 worldwide citation)

To reduce the time to make measurements and the noise in measurements obtained by probing a device supported on surface of a thermal chuck in a probe station, a conductive member is arranged to intercept current coupling the thermal unit of the chuck to the surface supporting the device. The conduct ...


7
Bryan J Root, William A Funk, John L Dunklee: Test systems with a probe apparatus and index mechanism. Celadon Systems, Hamre Schumann Mueller & Larson P C, March 31, 2015: US08994390 (2 worldwide citation)

A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through ...


8
Bryan J Root, William A Funk, John L Dunklee: Test apparatus having a probe card and connector mechanism. Celadon Systems, Hamre Schumann Mueller & Larson P C, April 28, 2015: US09018966 (2 worldwide citation)

A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through ...


9
William A Funk, John L Dunklee, Bryan J Root: Test systems with a probe apparatus and index mechanism. Celadon Systems, Hamre Schumann Mueller & Larson P C, August 8, 2017: US09726694 (1 worldwide citation)

A probe apparatus has probe wires with a contact pattern on one side. The contact pattern is for contacting a respective contact pattern on another test equipment or component, such as a circuit board. The probe wires have tips that probe a device desired for testing. Signals are transmitted through ...


10
Bryan J Root, William A Funk, Michael Palumbo, John L Dunklee: Test apparatus having a probe card and connector mechanism. Celadon Systems, Intel Corporation, Hamre Schumann Mueller & Larson P C, May 5, 2015: US09024651 (1 worldwide citation)

A test apparatus for testing a semiconductor device includes a circuit board having a contact pattern on one side and an opening therethrough, and a probe card supporting a probe needle array. The probe needle array is insertable into the opening of the circuit board and is configured to probe a dev ...