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K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 9, 2004: US06815963 (65 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


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K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 9, 2007: US07161363 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


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John Dunklee, Clarence E Cowan: Probe station with low inductance path. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, July 31, 2007: US07250779 (26 worldwide citation)

A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test ...


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John Dunklee: Switched suspended conductor and connection. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, May 22, 2007: US07221172 (23 worldwide citation)

A probe assembly having a switch that selectively electrically connects, for example, either a Kelvin connection or a suspended guard element with the probe assembly.


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John Dunklee: Chuck for holding a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 15, 2005: US06965226 (16 worldwide citation)

A chuck for a probe station that include a first chuck assembly element defining a substantially planar upper and lower surfaces, and another chuck assembly element defining a substantially planar surface. The chuck includes a spacing mechanism having exactly three independent supports interconnecti ...


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Peter Andrews, Brad Froemke, John Dunklee: Chuck with integrated wafer support. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 22, 2008: US07362115 (14 worldwide citation)

An improved chuck assembly with lift pins. The chuck assembly may have an outer periphery and an upper surface. The lift pins may be positioned within the periphery of the chuck assembly and may be capable of relative vertical movement with respect to the upper surface of the chuck assembly.


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K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for high-frequency testing of a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 4, 2007: US07304488 (11 worldwide citation)

A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a sec ...