1
John A Fifield, Howard L Kalter: Crosstalk-shielded-bit-line dram. International Business Machines Corporation, Howard J Walter Jr, April 23, 1991: US05010524 (94 worldwide citation)

This invention relates to semiconductor memories and includes a sense amplifier architecture in which sensed data bit or column lines are electrically isolated and shielded from their immediately adjacent active neighbors by utilization of non-selected bit lines as an AC ground bus. In its simplest ...


2
John E Barth Jr, Charles E Drake, John A Fifield, William P Hovis, Howard L Kalter, Scott C Lewis, Daniel J Nickel, Charles H Stapper, James A Yankosky: Dynamic RAM with on-chip ECC and optimized bit and word redundancy. International Business Machines Corporation, Mark F Chadurjian, July 28, 1992: US05134616 (84 worldwide citation)

A DRAM having on-chip ECC and both bit and word redundancy that have been optimized to support the on-chip ECC. The bit line redundancy features a switching network that provides an any-for-any substitution for the bit lines in the associated memory array. The word line redundancy is provided in a s ...


3
John A Fifield: Composite building element and methods of making and using the same. Oldcastle, April 2, 1996: US05502940 (82 worldwide citation)

A composite roofing element comprises a first layer of aggregate based material, a second layer of material having a density less than that of the first layer and has a wedge shaped region depending from its underside. The wedge shaped region is preferably integral with the second layer which can be ...


4
John A Fifield, Lawrence G Heller: Self biased differential amplifier with hysteresis. International Business Machines Corporation, Mark F Chadurjian, September 12, 2000: US06118318 (67 worldwide citation)

A self biased differential amplifier has a switching point accurately set according to a reference voltage. DC hysteresis is provided, by a circuit internal to the differential amplifier. The amplifier has an input circuit having first and second series connected transistors, wherein the beta ratio ...


5
Claude Louis Bertin, John A Fifield, Erik Leigh Hedberg, Russell J Houghton, Timothy Dooling Sullivan, Steven William Tomashot, William Robert Tonti: Impedance control using fuses. International Business Machines Corporation, Howard J Walker Jr esq, Scully Scott Murphy & Presser, October 31, 2000: US06141245 (65 worldwide citation)

A system and method for reducing impedance loading of semiconductor integrated circuit devices implementing protective device structures that contributes to impedance loading at an I/O pad connection. The method comprises providing a fuse device between the I/O pad connection and the protective devi ...


6
Claude L Bertin, John A Fifield, Russell J Houghton, William R Tonti, Nicholas M Van Heel: Methods and apparatus for blowing and sensing antifuses. International Business Machines Corporation, Kelly M Reynolds, Robert A Walsh, Dugan & Dugan, February 12, 2002: US06346846 (59 worldwide citation)

Methods and apparatus for blowing and sensing antifuses are provided. Specifically, in a first aspect, a method is provided for changing the state of one of a plurality of antifuses by selecting one of the bank of antifuses and applying a high voltage to change the state of the selected antifuse. In ...


7
John A Fifield, Erik L Hedberg, Claude L Bertin, Nicholas M van Heel: Programmable latch device with integrated programmable element. International Business Machines Corporation, Schmeiser Olsen & Watts, July 16, 2002: US06420925 (53 worldwide citation)

According to the present invention, a programable latch device for use in personalizing a semiconductor device is provided that overcomes the limitations of the prior art. The preferred embodiment programmable latch device can use both fuses and antifuses as programmable elements. The programmable l ...


8
John A Fifield, Wayne F Ellis, Nicholas M van Heel: Integrated fuse latch and shift register for efficient programming and fuse readout. International Business Machines Corporation, Steven Capella, Schmeiser Olsen & Watts, April 16, 2002: US06373771 (50 worldwide citation)

An integrated circuit device that obviates laser programming of a two-state element (e.g., a wire fuse or antifuse) by programming (i.e., changing) the conductive state of the two-state element according to a binary bit of programing data serially scanned in. Thereafter, the device can verify the ac ...


9
Robert M Blake, Douglas C Bossen, Chin Long Chen, John A Fifield, Howard L Kalter, Tin Chee Lo: Fault tolerant computer memory systems and components employing dual level error correction and detection with lock-up feature. International Business Machines, Lawrence D Cutter, October 15, 1991: US05058115 (47 worldwide citation)

In a memory system comprising a plurality of memory units each of which possesses unit-level error correction capabilities and each of which are tied to a system level error correction function, memory reliability is enhanced by providing means for fixing the output of one of the memory units at a f ...


10
Wilbur D Pricer, Wendell P Noble, John A Fifield, John E Gersbach: On-chip thermometry for control of chip operating temperature. International Business Machines Corporation, Howard J Walter Esq, Whitham Curtis & Whitham, February 16, 1999: US05873053 (47 worldwide citation)

Temperatures on a chip, including particular regions of a chip are monitored by sensing changes in sub-threshold conduction of a field effect transistor (FET) integrated on the chip due to changes in charge carrier population distribution with temperature therein. Such changes in sub-threshold curre ...