1
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Majestic Parsons Siebert & Hsue, August 12, 1997: US05657332 (492 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


2
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Majestic Parsons Siebert & Hsue, July 2, 1996: US05532962 (400 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


3
John S Mangan, Robert D Norman, Jeffrey Craig, Richard Albert, Anil Gupta, Jeffrey D Stai, Karl M J Lofgren: Flash EEPROM array data and header file structure. SunDisk Corporation, Western Digital Corporation, Majestic Parsons Siebert & Hsue, August 1, 1995: US05438573 (128 worldwide citation)

A file structure employed in a flash electrically erasable and programmable read only memory ("EEPROM") system and aspects of forming and using certain data fields within such a file structure. An array of rows and columns of EEPROM memory cells is divided into blocks of cells that are separately ad ...


4
John S Mangan, Robert D Norman, Jeffrey Craig, Richard Albert, Anil Gupta, Jeffrey D Stai, Karl M J Lofgren: Flash EEPROM array data and header file structure. SunDisk Corporation, Western Digital Corporation, Majestic Parsons Siebert & Hsue, November 28, 1995: US05471478 (107 worldwide citation)

A file structure employed in a flash electrically erasable and programmable read only memory ("EEPROM") system and aspects of forming and using certain data fields within such a file structure. An array of rows and columns of EEPROM memory cells is divided into blocks of cells that are separately ad ...


5
Jeffrey Craig Merrill, Hans Peter Ostergaard: Stripline balun. Anaren Microwave, Bond Schoeneck & King, September 25, 2001: US06294965 (51 worldwide citation)

A surface mount balun includes a first stripline segment having a first and second end, a first balanced port connected to the first end, and a second balanced port connected to the second end, a second stripline segment overlapping and coupled to the first stripline segment, and having a third end ...


6
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. Zilog, Majestic Parsons Siebert & Hsue, April 11, 2000: US06049899 (41 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


7
Abdelsalam Helal, Jeffrey Craig King, Raja Bose, Steven Lee Pickles, James A Russo, Steve Vander Ploeg, Hicham Mahmoud El Zabadani, Ahmad Hassan El Kouche: Modular platform enabling heterogeneous devices, sensors and actuators to integrate automatically into heterogeneous networks. University of Florida Research Foundation, Saliwanchik Lloyd & Eisenschenk, February 22, 2011: US07895257 (38 worldwide citation)

A system includes a hardware platform, at least one driver, a plurality of devices connected to the hardware platform, a middleware interface, and a plurality of software services. Each of the plurality of devices is selected from the group consisting of sensors and actuators. The plurality of softw ...


8
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, November 10, 2009: US07616484 (31 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


9
Jeffrey Craig, John S Mangan: Method and apparatus for dynamic degradation detection. SanDisk Corporation, Winston & Strawn, July 17, 2007: US07246268 (20 worldwide citation)

Methods and apparatus for automatically detecting when a memory system has significantly degraded are disclosed. According to one aspect of the present invention, a method for determining a status associated with a memory system which includes a plurality of sectors includes updating a counter, comp ...


10
Thomas Cremer, Jeffrey Craig: Method of purifying DNA. Steven B Kelber, Piper Rudnick, May 27, 2003: US06569621 (17 worldwide citation)

The present invention relates to a method of purifying a set of specific DNA molecules to be used in DNA-DNA hybridisations, as well as to DNA probes containing less than 2% Cot-1 DNA.