1
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having inner and outer shielding. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 14, 1999: US06002263 (57 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


2
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, March 26, 2002: US06362636 (50 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


3
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having inner and outer shielding. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, September 11, 2001: US06288557 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


4
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 28, 2003: US06639415 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


5
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 3, 2002: US06489789 (49 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


6
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 11, 2005: US06842024 (47 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


7
Jeffrey A Hawkins: Method and apparatus for calibrating an optical document digitizer. Tektronix, David P Petersen, Francis I Gray, Robert S Hulse, August 12, 1986: US04605970 (31 worldwide citation)

A calibration strip (80) is described for use in calibrating an optical document digitizer. The strip (80) includes an optically detectible pattern including plural discrete blocks (82) with orthogonal first and second edges (84, 86). Edges (84) are parallel to the drum axis when strip (80) is mount ...


8
Evan E Patton, Jonathan D Reid, Jeffrey A Hawkins, Dinesh S Kalakkad, Steven T Mayer: Clamshell apparatus with dynamic uniformity control. Novellus Systems, Beyer Weaver & Thomas, June 29, 2004: US06755946 (27 worldwide citation)

The present invention includes apparatus and methods for measuring impedance of a layer of deposited metal on a substrate and controlling deposition uniformity during electroplating. A first circuit delivers plating current to a metal layer on the substrate, and a second circuit, electrically isolat ...


9
Ron A Peters, Leonard A Hayden, Jeffrey A Hawkins, R Mark Dougherty: Probe station having multiple enclosures. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 1, 2009: US07626379 (21 worldwide citation)

A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between an ...


10
Evan E Patton, Jonathan D Reid, Jeffrey A Hawkins, Dinesh S Kalakkad: Clamshell apparatus with crystal shielding and in-situ rinse-dry. Novellus Systems, Beyer Weaver & Thomas, April 25, 2006: US07033465 (19 worldwide citation)

Certain mechanisms of a plating apparatus address problems associated with interaction between plating solutions or other processing solutions and the components of the plating apparatus (such as the electrical contacts). For example, a circumferential spray skirt around the interface of a “cup” and ...