1
January Kister: Large scale protrusion membrane for semiconductor devices under test with very high pin counts. Probe Technology Corporation, Thomas E Schatzel, June 6, 1995: US05422574 (166 worldwide citation)

An embodiment of the present invention is a probe membrane with a center contact bump area and a plurality of signal connection sections separated by triangular reliefs in the membrane and terminating in a tangential row of contacts for wire bonding to a probe card. The system of triangular reliefs ...


2
January Kister, Jerzy Lobacz: Membrane for holding a probe tip in proper location. Probe Technology, Lumen Intellectual Property Services, April 21, 1998: US05742174 (120 worldwide citation)

A method and device for accurately mounting a probe in a probe card and for maintaining correct location of the probe tip as the probe is used for electronic testing of an IC pad. A membrane having a slot is attached to a support structure of a probe card. The probe tip is inserted into the slot and ...


3
January Kister: Method for making a probe preserving a uniform stress distribution under deflection. Probe Technology, Lumen Intellectual Property Services, February 24, 1998: US05720098 (99 worldwide citation)

The invention presents a method and a correspondingly designed probe for achieving uniform stress distribution when experiencing deflection. The probe has a top edge, a bottom edge, a tip, and a beam portion defined by selecting an inflection point along the top edge, such that the beam portion is c ...


4
January Kister: Dual contact probe assembly for testing integrated circuits. Probe Technology, Lumen Intellectual Property Services, June 9, 1998: US05764072 (60 worldwide citation)

An assembly for making electrical connections to unpackaged integrated circuits using dual contact probes. The probes are said to be dual contact because they contact both the integrated device under test and the testing circuit. The probes have two tips. One tip is located at the end of each leg of ...


5
January Kister: Probe assembly having floatable buckling beam probes and apparatus for abrading the same. Kulicke & Soffa Investment, Lumen Intellectual Property Services, July 16, 2002: US06419500 (56 worldwide citation)

The present invention provides a method for sanding heads of buckling beam probes while the probes are disposed within a probe assembly between a lower die and upper die. Sanding provides that all the probes within a probe assembly have the same total length from tip to head. The method calls for co ...


6
January Kister, Jean Michel Jurin, Isabelle George: Modulated space transformer for high density buckling beam probe and method for making the same. Kulicke & Soffa Investment, Lumen Intellectual Property Services, July 16, 2002: US06420887 (48 worldwide citation)

A space transformer made up of a primary structure that is fabricated from semiconductor body for retaining beam probes used for contacting the pads of a circuit or device under test. The primary structure is part of the space transformer and has vias that hold the beam probes, and a ceramic support ...


7
January Kister: Method for making a probe apparatus for testing integrated circuits. Kulicke and Soffa Investments, Lumen Intellectual Property Services, March 11, 2003: US06530148 (44 worldwide citation)

The present invention provides a method for sanding heads of buckling beam probes while the probes are disposed within a probe assembly between a lower die and upper die. Sanding provides that all the probes within a probe assembly have the same total length from tip to head. The method calls for co ...


8
January Kister: Probe apparatus having removable beam probes. Kulicke & Soffa Investment, Lumen Intellectual Property Services, July 23, 2002: US06424164 (42 worldwide citation)

An apparatus for electronically testing of bound electrical circuits connected to planar arrayed pads having removable mounted conductive beam probes to simplify the manufacturing and maintaining process. A space transformer comprises from outside electrically accessible conductive holes wherein the ...


9
January Kister: Modular probe apparatus. Kulicke and Soffa Investments, Lumen Intellectual Property Services, February 25, 2003: US06525552 (39 worldwide citation)

A probe apparatus is provided with a number of space transformer segments that are fixated such that probe offset due to warping is kept to a minimum. In a first embodiment, the space transformer segments are permanently fixated. In a second embodiment the space transformer segments are included tog ...


10
Krzysztof Dabrowiecki, January Kister, Jerzy Lobacz: Assembly structure for making integrated circuit chip probe cards. Probe Technology, Lumen Intellectual Property Services, March 23, 1999: US05884395 (38 worldwide citation)

This disclosure proposes an assembly structure for building probe cards to test square integrated circuit chips. The test probe card assembly structure has one or more wings located at 90.degree. angles to each other upon which probes are laid in a parallel manner for attachment to a probe card. Thi ...