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Robert Senzig Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. Ziolkowski Patent Solutions Group, March 16, 2006: US20060056581-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


2
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. General Electric Company, Ziolkowski Patent Solutions Group SC, August 21, 2007: US07260174 (42 worldwide citation)

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


3
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating ct detector with over-ranging correction. General Electric Company, Global Research, December 11, 2008: US20080304618-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


4
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating ct detector with over-ranging correction. General Electric Company, Global Research, October 25, 2007: US20070248209-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


5
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating ct detector with over-ranging correction. General Electric Company, Global Research, September 6, 2007: US20070206722-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


6
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating ct detector with over-ranging correction. Ziolkowski Patent Solutions Group Sc, June 21, 2007: US20070140418-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


7
Talal Kamel Jaber, Johnny James LeBlanc, Ronald Gene Walther: Apparatus and method for testing high speed components using low speed test apparatus. International Business Machines Corporation, Leslie A Van Leeuwen, Anthony V S England, April 25, 2000: US06055658 (33 worldwide citation)

A system for testing a high speed integrated circuit includes a test device having a test clock with a first maximum frequency for performing level sensitive scan design (LSSD) testing of the integrated circuit device under test, a frequency multiplier circuit for multiplying the test clock signal t ...


8
Ravi Kumar Arimilli, Roger Ned Bailey, Johnny James Leblanc, Timothy M Skergan: Globally distributed scan blocks. International Business Machines Corporation, Richard F Frankeny, Mark E McBurney, Winstead Sechrest & Minick P C, December 16, 2003: US06665828 (17 worldwide citation)

A method and system for testing an integrated circuit (IC) comprising a plurality of logic units and a plurality of level sensitive scan design latches (LSSD) chains (scan chains) where the partitioning of the scan chains is different than the partitioning of the logic units. Scan blocks, each scan ...


9
Xiaoye Wu, James LeBlanc, Armin Pfoh: Method and apparatus for generating a density map using dual-energy CT. General Electric Company, Fletcher Yoder, June 7, 2005: US06904118 (16 worldwide citation)

The present technique provides for the generation of density maps using one or more basis material decomposition tables or functions. The basis material decomposition tables or functions are generated by simulating the system response to various lengths of basis materials using component characteris ...


10
Kent Burr, Adrian Ivan, James Leblanc: Time-of-flight capable high resolution pet detector. General Electric Company, Fletcher Yoder, March 20, 2007: US07193208 (11 worldwide citation)

An array of position-sensitive avalanche photodiodes is provided in which output signal contacts from corners of each photodiode are grouped in common for readout. Each photodiode may be provided on a single wafer or chip, with photodiodes being separated by a trench or a groove. Corners of each pho ...



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