1
Paul G Tobin, Hosein Naaseh Shahry: Test systems for obtaining a sample-on-the-fly event trace for an integrated circuit with an integrated debug trigger apparatus and an external pulse pin. Hewlett Packard Company, June 23, 1998: US05771240 (102 worldwide citation)

Presented is test system for use in debugging functional and electrical failures of an integrated circuit. The test system includes a diagnostics retrieval system and a test access port retrieval system external to the integrated circuit under test, and a debug trigger apparatus and test access port ...


2
Paul G Tobin, Hosein Naaseh Shahry, Stephen R Undy: Integrated debug trigger method and apparatus for an integrated circuit. Hewlett Packard Company, May 12, 1998: US05751735 (50 worldwide citation)

Presented is an internal integrated debug trigger apparatus for use in debugging functional and electrical failures of an integrated circuit chip. The debug trigger apparatus includes a plurality of software programmable trigger registers and a plurality of software programmable trigger function blo ...


3
Hosein Naaseh Shahry, Paul G Tobin: Debug system with raw mode trigger capability. Hewlett Packard Company, September 22, 1998: US05812830 (16 worldwide citation)

Disclosed herein is sophisticated but low-cost debug hardware which may be used to identify the root cause of a functional or electrical problem in a microprocessor chip. The debug system comprises a raw mode trigger capability which allows microprocessor events to be generated either synchronously ...