1
Hideo Arima, Kenji Takeda, Hideho Yamamura, Fumiyuki Kobayashi: Semiconductor chip carrier, module having same chip carrier mounted therein, and electronic device incorporating same module. Hitachi, Fay Sharpe Beall Fagan Minnich & McKee, January 25, 1994: US05281151 (132 worldwide citation)

A semiconductor chip carrier, an electronic module having the semiconductor chip carrier mounted therein, and an electronic device incorporating the electronic module. A semiconductor chip carrier comprises a multi-layer wiring substrate including a multi-layer ceramic board, and a thin film circuit ...


2
Hideho Yamamura: BGA type semiconductor device and electronic equipment using the same. Hitachi, Mattingly Stanger & Malur P C, December 19, 2000: US06163071 (47 worldwide citation)

A BGA type semiconductor device which realizes its high speed operation and high integration density by shortening power supply or grounding wires to reduce its inductance. In the BGA type semiconductor device, the power supply or grounding wires are provided in the vicinity of the center of a BGA b ...


3
Hideho Yamamura, Masakazu Yamamoto, Naoki Maru, Satoshi Muraoka: Electronic circuit device having a function of inhibiting resonance in power wiring. Hitachi, Antonelli Terry Stout & Kraus, December 1, 1998: US05844762 (10 worldwide citation)

An electronic circuit device having a power wiring resonance inhibition function includes a plurality of electronic circuit elements, and a wiring board having the electronic circuit elements disposed thereon. The wiring board includes a plurality of planar power supply wires for supplying power to ...


4
Takashi Saitoh, Nobuya Niizaki, Hideho Yamamura, Shinichi Hayashi: Delay circuit including an improved CR integrator circuit. Hitachi, Hitachi Electronics Engineering, Antonelli Terry & Wands, December 1, 1987: US04710654 (10 worldwide citation)

The delay circuit of the present invention has a CR integrator including a variable capacitance diode. This CR integrator is arranged between the first and second comparators. By applying a constant DC comparison voltage to the other input terminal of the second comparator, delay amounts can be sele ...


5
Hideho Yamamura: BGA type semiconductor device and electronic equipment using the same. Hitachi, Mattingly Stanger & Malur P C, May 11, 2004: US06734545 (6 worldwide citation)

A BGA type semiconductor device which realizes its high speed operation and high integration density by shortening power supply or grounding wires to reduce its inductance. In the BGA type semiconductor device, the power supply or grounding wires are provided in the vicinity of the center of a BGA b ...


6
Hideho Yamamura: Electronic device having high-density wiring. Hitachi, Antonelli Terry Stout & Kraus, March 8, 1994: US05293005 (5 worldwide citation)

An electronic device having high density wiring formed in a multi-level layer structure which has a plurality of conductors distributed with high density. Each conductor is formed to have a sectional area which is determined on the basis of length thereof such that ones of the plurality of conductor ...


7
Hideho Yamamura, Naoki Maru: Over voltage detection circuit, and power source circuit, power supply system and electronic apparatus using the over voltage detection circuit. Hitachi, Antonelli Terry Stout & Kraus, May 13, 2008: US07372683 (4 worldwide citation)

An over voltage detection circuit, which is used in a power source, a power supply system, and an electronic apparatus, includes two voltage comparison circuits. A first comparison circuit, provided for high-speed signal responses, includes voltage dividing resistors, a voltage comparator, and a ref ...


8
Hideho Yamamura, Naoki Maru, Satoshi Tomioka, Motoharu Ueguri: Overvoltage protection circuit, and power source, power supply system and electronic apparatus using the overvoltage protection circuit. Hitachi, Densei Lambda, Antonelli Terry Stout & Kraus, April 8, 2008: US07355829 (4 worldwide citation)

In a redundant configuration with multiple power sources connected in parallel to enhance reliability, a power source in which an overvoltage failure occurred has been difficult to identify and unable to be deactivated, which has impeded the improvement of reliability. However, it has become possibl ...


9
Naoki Maru, Hideho Yamamura, Koji Nisisu, Shigeo Oomae: Current detection circuit, and power supply apparatus, power supply system and electronic apparatus using the current detection circuit. Hitachi, Antonelli Terry Stout & Kraus, April 24, 2007: US07208883 (3 worldwide citation)

In the current detection circuit that detects the output currents of a switching power supply circuit, an improved current detection circuit makes it possible to detect the output current directions of power supplies solves the malfunction of the power supplies vibrating or diverging during changes ...


10
Hideho Yamamura, Mamoru Ogihara, Naoki Maru: Parallel power system and an electronic apparatus using the power system. Hitachi, Mattingly Stanger & Malur P C, September 30, 2003: US06628010 (3 worldwide citation)

A parallel power system is provided which can flexibly change output currents and the number of channels in short time and at low cost. A back board