1
Heinz Mattes: Apparatus and method for recording, communicating and administering digital images. Siemens Aktiengesellschaft, Hill & Simpson, March 14, 2000: US06038295 (231 worldwide citation)

A communication system includes at least one telephone unit, a transmission system for communicating from the telephone unit, and a server for receiving information via the transmission system. The telephone unit includes a digital image pick up by which images are recorded, transmitted to the serve ...


2
Heinz Mattes: Method in a parallel test apparatus for semiconductor memories. Siemens Aktiengesellschaft, Hill Steadman & Simpson, June 29, 1993: US05224107 (12 worldwide citation)

A method in a parallel test apparatus provides for parallel testing a plurality of memory cells of a semiconductor module in parallel. The information read from the memory cells that are forwarded via the parallel test apparatus are tested to determine whether or not all cells are free of error. Whe ...


3
Heinz Mattes, Sebastian Sattler: Device and method for measuring jitter. Infineon Technologies, Edell Shapiro & Finnan, July 7, 2009: US07558991 (9 worldwide citation)

A test device contains a data pattern generator for providing a delta-sigma-modulated data stream sampled with a sampling frequency fs at its output. A phase modulator generates a test clock subjected to jitter and having the clock frequency ft at its output. The output of the data pattern generator ...


4
Heinz Mattes, Thomas Piorek, Sebastian Sattler, Olaf Stroeble: Electrical circuit for measuring times and method for measuring times. Infineon Technologies, Dicke Billig & Czaja PLLC, January 26, 2010: US07653170 (7 worldwide citation)

An electrical circuit used for measuring times is disclosed. In one embodiment, the electrical circuit has a counter, a decoder and a multiplicity of time trap elements. At least the counter and the time trap elements are located together on an integrated semiconductor component. Each time trap elem ...


5
Herbert Eichfeld, Heinz Mattes: Integrated circuit with memory programmable pad driver. Siemens Aktiengesellschaft, Hill & Simpson, November 10, 1998: US05834955 (6 worldwide citation)

The integrated circuit with programmable pad driver involves an integrated circuit (IS1) with at least one pad driver that has a programming unit (PE) and a plurality of sub-drivers (T1 . . . Tm). A specific driver intensity and edge steepness of the pad driver can be set in that a corresponding plu ...


6
Heinz Mattes, Sebastian Sattler: Device and method for testing integrated circuits. Infineon Technologies, Dicke Billig Czaja PLLC, July 15, 2008: US07400995 (3 worldwide citation)

A test device and method is disclosed. In one embodiment, the test device includes a precision signal generator for generating a test signal, which generator is connected via a respective connecting line to a respective input contact intended for connection to an input of an integrated circuit, and ...


7
Heinz Mattes, Sebastian Sattler: Electrical circuit and method for testing integrated circuits. Infineon Technologies, Dicke Billig Czaja PLLC, August 14, 2007: US07256602 (3 worldwide citation)

An electrical circuit including a test circuit and a method of testing electrical circuits is disclosed. In one embodiment, the circuit includes a electrical short-circuit protective circuit according to the invention for protecting an input contact against short-circuit having an input which is int ...


8
Heinz Mattes, Sebastian Sattler: Electronic test circuit for an integrated circuit and methods for testing the driver strength and for testing the input sensitivity of a receiver of the integrated circuit. Infineon Technologies, Banner & Witcoff, December 30, 2008: US07471220 (1 worldwide citation)

The electronic test circuit for an integrated circuit to be tested has an input for receiving an analog data stream (23), a programmable digital line emulator (TPE1) for emulating properties of a transmission path and an output for emitting an analog data stream (24) having a signal-to-noise ratio w ...


9
Michael Goessel, Andreas Leininger, Heinz Mattes, Sebastian Sattler: Evaluation circuit and method for detecting and/or locating faulty data words in a data stream T. Infineon Technologies, Dicke Billig & Czaja PLLC, November 15, 2011: US08060800 (1 worldwide citation)

An evaluation circuit and method for detecting faulty data words in a data stream is disclosed. In one embodiment the evaluation circuit according to the invention includes a first linear automaton circuit and also a second linear automaton circuit connected in parallel, each having a set of states ...


10
Claus Dworski, Heinz Mattes, Sebastian Sattler: Test apparatus and method for testing analog/digital converters. Infineon Technologies, Banner & Witcoff, June 24, 2008: US07391349 (1 worldwide citation)

A method for testing AD converters (10) may have the steps of a) producing a digital test signal, b) producing an analog test signal as input signal for the AD converter (10) from the digital test signal, c) producing a sinusoidal, digital reference signal whose frequency is equal to or an integer m ...