1
Hashimoto Kiyokazu C O Nec Cor: Non-volatile semiconductor memory device.. Nippon Electric Co, June 30, 1993: EP0548866-A2 (9 worldwide citation)

In collectively and electrically erase a plurality of memory cells, to set the threshold values of the memory cells constant, electrons are previously stored in the floating gates of the memory cells (M11-Mlm) (S1). The memory cells whose floating gates are accumulated with electrons are electricall ...


2
Hashimoto Kiyokazu C O Nec Cor: Semiconductor memory device.. Nippon Electric Co, May 25, 1988: EP0268289-A2 (5 worldwide citation)

For sufficient diagnostic operation, there is disclosed a semiconductor memory device having a write-in mode, a read-out mode and a diagnostic mode, comprising; a) a check-bit producing circuit (52) operative to produce check-bits based on data bits of a data information supplied from the outside th ...