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Gleason Reed, Strid Eric W, Flegal Robert T, Mccamant Angus J: Wafer probes.. Tektronix, August 5, 1987: EP0230766-A1 (37 worldwide citation)

A wafer probe comprises a support member having an end region which is shaped to permit the end region to be brought into close proximity with a component under test. An amplifier is mounted on the support member at its end region. A conductive probe element is attached to the amplifier and is elect ...


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Smith Kenneth, Gleason Reed: Membrane probing system. Cascade Microtech, Smith Kenneth, Gleason Reed, RUSSELL Kevin L, June 26, 2003: WO/2003/052435

A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal con ...


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Gleason Reed, Bayne Michael A, Smith Kenneth, Lesher Timothy, Koxxy Martin: Membrane probing system. Cascade Microtech, June 21, 2002: TW492219

A substrate, preferably constructed of a ductile material and a tool having the desired shape of the resulting device for contacting contact pads on a test device is brought into contact with the substrate. The tool is preferably constructed of a material that is harder than the substrate so that a ...


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