1
Fred H Pollak, Hong En Shen: Method and apparatus for determining a materials characteristics by photoreflectance using improved computer control. Brooklyn College Foundation, Paul M Craig Jr, December 14, 1993: US05270797 (17 worldwide citation)

A method and apparatus for determining the characteristics of materials, particularly of semiconductors, semiconductor heterostructures and semiconductor interfaces by the use of photoreflectance, in which monochromatic light and modulated light beam reflected from the sample is detected to produce ...


2
Hal C Felsher, Fred H Pollak, Arthur Bradley: Thin film photovoltaic converter and method of preparing same. Martha G Pugh, July 29, 1980: US04214916 (16 worldwide citation)

The photovoltaic converter of the present invention comprises a thin film consisting essentially of a lattice of stacked carbon chains comprising alternating single and double bonds deposited on the surface of an electrode transparent to sunlight. The carbon lattice is prepared in situ by depositing ...


3
Fred H Pollak, Hong En Shen: Method and apparatus for determining a materials characteristics by photoreflectance. Paul M Craig Jr, November 9, 1993: US05260772 (13 worldwide citation)

A method and apparatus for determining the characteristics of materials, particularly of semi-conductors, semi-conductor heterostructures and semi-conductor interfaces by the use of photoreflectance, in which monochromatic light and modulated light beam reflected from the sample is detected to produ ...


4
Fred H Pollak, Hong En Shen, Gerald Lucovsky: Method for determining interface properties of semiconductor materials by photoreflectance. Paul M Craig Jr, October 19, 1993: US05255070 (11 worldwide citation)

A method for determining information about properties at interfaces of semi-conductor materials in which a probe bean monochromatic light is directed onto a material sample which is itself electromodulated by a modulated pump beam, whereby the light reflected from the sample is detected to produce a ...


5
Fred H Pollak, Xiaoming Yin: Contractless mode of electroreflectance. Brooklyn College Research and Development Foundation, Paul M Craig Jr, February 15, 1994: US05287169 (9 worldwide citation)

A method and apparatus for a contactless mode of electroreflectance (ER) which utilizes a condenser-like system, of which the front electrode is light transparent, i.e., for instance, consists of a transparent conductive coating on a transparent substrate which is separated from the sample surface b ...


6
Fred H Pollak, Paul M Raccah: Method and apparatus for measuring variations in composition in binary and ternary semiconductors utilizing electrolyte electroreflectance. Yeshiva University, Gottlieb Rackman & Reisman, March 6, 1979: US04142802 (8 worldwide citation)

There is disclosed an apparatus and method for measuring the variations in composition across the surface of binary and ternary alloy semiconductors utilizing electrolyte electroreflectance. The technique is non-destructive, can readily be employed under atmospheric conditions at room temperature, a ...


7
Fred H Pollak, J M Woodall, P A Montano: Method for in-situ determination of the fermi level in GaAs and similar materials by photoreflectance. Paul M Craig Jr, October 27, 1992: US05159410 (8 worldwide citation)

A method for in-situ determination by photoreflectance of the Fermi level (V.sub.F) at the surfaces or interfaces of GaAs and related materials, in which a probe beam of monochromatic light and a modulated pump beam from a pump source are directed onto a sample, and the measured barrier height V.sub ...


8
Fred H Pollak, Hong En Shen: Photoreflectance method and apparatus utilizing acousto-optic modulation. Paul M Craig Jr, October 19, 1993: US05255071 (7 worldwide citation)

A method and apparatus for determining the characteristics of materials, particularly of semi-conductors, semi-conductor heterostructures and semi-conductor interfaces by the use of photoreflectance, in which monochromatic light and an acousto-optically modulated light beam reflected from the sample ...