1
Edward E Kelley, Franco Motika, Paul V Motika, Eric M Motika: Secure credit card. International Business Machines Corporation, Jay H Anderson, Whitham Curtis & Christofferson P C, November 4, 2003: US06641050 (201 worldwide citation)

Credit card or portable identification cards containing smart card technology and electronic fuse (e-fuse) technology are combined with an LFSR pseudo random number generator to provide a secured method to prevent fraud and unauthorized use. Secure personalization via e-fuses, a pseudo-random number ...


2
Edward E Kelley, Franco Motika: Secure credit card with near field communications. International Business Machines Corporation, Whitham Curtis Christofferson & Cook PC, James J Cioffi, October 31, 2006: US07128274 (110 worldwide citation)

A near field communication device included in a secure transaction card provides an addition and/or transitional communication link for communicating secure transaction information. The near field communication device may be selectively engaged or disengaged and, when engaged, either active or passi ...


3
Norman J Dauerer, Edward E Kelley, Franco Motika: Virtual windows desktop. International Business Machines Corporation, Peter W Peterson, Aziz M Ahsan, DeLio & Peterson, November 24, 1998: US05841435 (97 worldwide citation)

A process for a virtual windows desktop system visually organizing multiple computer application objects on a computer screen comprising the steps of: 1) providing for a virtual display with application objects arranged thereon and having a virtual area larger than the screen when the application ob ...


4
Gobinda Das, Franco Motika: TFI probe I/O wrap test method. International Business Machines Corporation, Connolly Bove Lodge & Hutz, Larry J Hume, Robert Walsh Esq, March 7, 2006: US07007380 (93 worldwide citation)

A method for testing external connections to semiconductor devices. The method includes providing an external electrical path between selected external connections on the semiconductor devices.


5
Edward B Eichelberger, Eric Lindbloom, Franco Motika, John A Waicukauski: Weighted random pattern testing apparatus and method. International Business Machines Corporation, John D Crane, January 31, 1989: US04801870 (86 worldwide citation)

A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the out ...


6
Edward B Eichelberger, Roger N Langmaid, Eric Lindbloom, Franco Motika, John L Sinchak, John A Waicukauski: Weighted random pattern testing apparatus and method. International Business Machines Corporation, John D Crane, Robert E Sandt, August 18, 1987: US04687988 (77 worldwide citation)

A method and apparatus for testing very large scale integrated circuit devices, most particularly Level Sensitive Scan Design (LSSD) devices, by applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test, collecting the out ...


7
Timothy J Koprowski, Franco Motika: Logic built-in self test. International Business Machines Corporation, Lynn Augspurger, Cantor Colburn, December 4, 2001: US06327685 (63 worldwide citation)

A BIST method that modifies the scan chain path and scan clocks to allow for distributed BIST test. In this distributed BIST concept, the Linear Feedback Shift Register (LFSR) and the Multiple Input Signature Register (MISR) are combined as an integral part of the scan chain, and each scan cycle is ...


8
Franco Motika, Stephen V Pateras, John James Shushereba: Weighted random pattern built-in self-test. International Business Machines Corporation, James M Leas, November 9, 1999: US05983380 (58 worldwide citation)

An integrated circuit comprising logic circuits and self-test circuits for testing logic circuits including a pseudo random pattern generator for generating at least one pseudo random pattern and weighing circuit for weighing the pseudo random pattern. The weighting circuit and pseudo random pattern ...


9
Franco Motika, Phillip J Nigh, Peilin Song, Howard B Druckerman: AC scan diagnostic method. International Business Machines Corporation, Lynn L Augspurger, February 4, 2003: US06516432 (51 worldwide citation)

Disclosed is an alternating current (AC) scan diagnostic system in which one or a plurality of scan chains are tested by serially propagating predetermined bit patterns through the scan chain and comparing the output against an expected result. The system comprises identification phase, verification ...


10
Orazio P Forlenza, Mary P Kusko, Franco Motika: Look ahead scan chain diagnostic method. International Business Machines Corporation, Lynn L Augspurger, October 23, 2001: US06308290 (47 worldwide citation)

Look ahead testing process diagnoses broken or stuck-at scan chains to a failing shift register latch for improving the final manufacturing process and suggesting potentials for design change prior to manufacturing in order to improve yield levels. Post test data collection, analysis, and diagnosis ...