1
Dennis R Conti, John Lafferty: Applying parametric test patterns for high pin count ASICs on low pin count testers. International Business Machines Corporation, McGinn & Gibb PLLC, Robert A Walsh Esq, January 25, 2005: US06847203 (65 worldwide citation)

Disclosed is an integrated circuit chip test apparatus that has a module test fixture having contact pads that are adapted to make contact with signal input/output pins on an integrated circuit chip being tested. An intermediate banking box is connected to the module text fixture and a tester is con ...


2
Thomas W Bachelder, Dennis R Barringer, Dennis R Conti, James M Crafts, David L Gardell, Paul M Gaschke, Mark R Laforce, Charles H Perry, Roger R Schmidt, Joseph J Van Horn, Wade H White: Segmented architecture for wafer test and burn-in. International Business Machines Corporation, William N Hogg, Robert A Walsh, August 14, 2001: US06275051 (60 worldwide citation)

An apparatus for simultaneously testing or burning in a large number of the integrated circuit chips on a product wafer includes probes mounted on a first board and tester chips mounted on a second board, there being electrical connectors connecting the two boards. The tester chips are for distribut ...


3
Dennis R Conti, David R Dewar, Robert Fonseca, Robert R Wood: Method for choosing replacement lines in a two dimensionally redundant array. International Business Machines Corporation, Sughrue Mion Zinn Macpeak and Seas, June 14, 1988: US04751656 (22 worldwide citation)

A method of assigning replacement rows and colums in a two dimensionally redundant array in which if the number of failures along a row exceeds the number of remaining redundant columns, then replacing that row with one of the redundant rows. The process is repeated in the opposite direction with th ...


4
Dennis R Conti, Roger Gamache, David L Gardell, Marc D Knox, Jody J Van Horn: Device burn in utilizing voltage control. International Business Machines Corporation, William N Hogg, Driggs Hogg & Fry Co LPA, September 4, 2007: US07265561 (1 worldwide citation)

According to the present invention, a method of controlling the burning in of at least one I/C device in a burn in tool is provided. For high power device, the tool has a heat sink positioned to contact each device being burned in, and has a socket for mounting each device to be burned in, and a pow ...


5
Harold Chase, Dennis R Conti, James M Crafts, David L Gardell, Andrew T Holle, Adrian Patrascu, Jody J Van Horn: Programmable active thermal control. International Business Machines Corporation, Cantor Colburn, Michael LeStrange, October 6, 2015: US09152517

Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coup ...


6
Thomas W Bachelder, Dennis R Barringer, Dennis R Conti, James M Crafts, David L Gardell, Paul M Gaschke, Mark R Laforce, Charles H Perry, Roger R Schmidt, Joseph J Van Horn, Wade H White: Segmented architecture for wafer test & burn-in. International Business Machines Corporation, Driggs Lucas Brubaker & Hogg Co Lpa, December 13, 2001: US20010050567-A1

An apparatus for simultaneously testing or burning in a large number of the integrated circuit chips on a product wafer includes probes mounted on a first board and tester chips mounted on a second board, there being electrical connectors connecting the two boards. The tester chips are for distribut ...


7
Dennis R Conti, John Lafferty: Applying parametric test patterns for high pin count asics on low pin count testers. International Business Machines Corporation, Frederick W Gibb Iii, Mcginn & Gibb Pllc, January 6, 2005: US20050001611-A1

Disclosed is an integrated circuit chip test apparatus that has a module test fixture having contact pads that are adapted to make contact with signal input/output pins on an integrated circuit chip being tested. An intermediate banking box is connected to the module text fixture and a tester is con ...


8
Dennis R Conti, Roger Gamache, David L Gardell, Marc D Knox, Jody J Van Horn: Device burn in utilizing voltage control. International Business Machines Corporation, Driggs Lucas Brubaker & Hogg Co Lpa, March 31, 2005: US20050068053-A1

According to the present invention, a method of controlling the burning in of at least one I/C device in a burn in tool is provided. For high power device, the tool has a heat sink positioned to contact each device being burned in, and has a socket for mounting each device to be burned in, and a pow ...


9
Harold Chase, Dennis R Conti, James M Crafts, David L Gardell, Andrew T Holle, Adrian Patrascu, Jody J Van Horn: Programmable active thermal control. International Business Machines Corporation, October 25, 2012: US20120272100-A1

Test equipment provides interrupt capability to automatic testing as a means of actively controlling temperature of the device under test. A processor coupled to memory is responsive to computer-executable instructions contained in the memory. A test socket is coupled to a device under test and coup ...