1
Leslie A Lane, Lynn V Lybeck, David S Perloff, Shoji Kumagi: Process control interface with simultaneously displayed three level dynamic menu. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, October 10, 1989: US04873623 (210 worldwide citation)

A system and method for computer control of machine processes. The operator of the system selects and specifies process control parameters through the use of a three level dynamic menu. The first level of the menu is used to select a group of process parameters. The second and third menus together h ...


2
Michael K Baker, Leslie A Lane, David S Perloff, Alexander Freedland: Data analysis system and method for industrial process control systems. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, July 6, 1993: US05226118 (150 worldwide citation)

A data analysis computer system stores measurement data obtained from a multiplicity of distinct predefined processes. The system can store definitions for many data analysis charts, each of which depicts stored measurement data for a specified process. Further, chart groups can be defined. Each cha ...


3
Chester Mallory, David S Perloff, Hung V Pham, Sandor Droblisch: Apparatus and methods for semiconductor wafer testing. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, July 5, 1988: US04755746 (136 worldwide citation)

An automatic system for performing sheet resistivity testing on surface layers of semiconductor wafers, including a wafer handling stage having a platform for carrying a semiconductor wafer, and an arrangement for mounting the platform for rotation about a central axis and for translation of the pla ...


4
Leslie A Lane, Lynn V Lybeck, David S Perloff, Shoji Kumagi: Process control interface system for managing measurement data. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, October 30, 1990: US04967381 (132 worldwide citation)

A system and method for computer control of machine processes. The system and method provide a set of predefined data management or data analysis tasks which an operator of the system can use when using the system to run a selected process.


5
Leslie A Lane, Lynn V Lybeck, David S Perloff, Chester L Mallory: Multi-level dynamic menu which suppresses display of items previously designated as non-selectable. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, June 27, 1989: US04843538 (88 worldwide citation)

A process control interface includes a multi-level dynamic menu for selecting processes from a set of processes that are organized into groups and subgroups. An engineering set up control program enables an engineer to denote which of these groups, subgroups and processes are available for selection ...


6
Leslie A Lane, Lynn V Lybeck, David S Perloff, Chester L Mallory: Process control interface system for designer and operator. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, July 7, 1987: US04679137 (55 worldwide citation)

A system and method for computer control of machine processes, including a dynamic menu feature used in the selection of processes and the definition and selection of operating parameters used by a process control program to direct the performance of the process by the machine.


7
Leslie A Lane, Lynn V Lybeck, David S Perloff, Chester L Mallory: Process control interface system for managing measurement data. Prometrix Corporation, February 14, 1989: US04805089 (50 worldwide citation)

A method of controlling a process using a programmed digital computer with a set of process control programs. An operator control program allows the user to select and run a specified process and to collect measurement data while the selected process is run. A data analysis program enables interacti ...


8
Leslie A Lane, Lynn V Lybeck, David S Perloff, Chester L Mallory: Multilevel menu and hierarchy for selecting items and performing tasks thereon in a computer system. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, August 21, 1990: US04951190 (27 worldwide citation)

A method of selecting items from a hierarchy of items and then performing a selected task on the selected set of items. An engineering set up control program includes a procedure for denoting processes, groups of processes, and subgroups of processes which are available for use by operators of the s ...


9
David S Perloff, Chester Mallory: Apparatus and methods for resistivity testing. Prometrix Corporation, Flehr Hohbach Test Albritton & Herbert, October 27, 1987: US04703252 (20 worldwide citation)

An automatic sheet resistance mapping system for semiconductor wafers which has the capability of taking high accuracy, multiple test readings in both contour scan and diameter scan modes. A rotatable wafer stage carries a semiconductor wafer thereon with the center of the wafer positioned substanti ...


10
Paul E Larson, John F Moulder, David G Watson, David S Perloff: System and method for depth profiling and characterization of thin films. Revera Incorporated, Blakely Sokoloff Taylor & Zafman, November 11, 2008: US07449682 (4 worldwide citation)

Characterization of a sample, e.g., a depth profile, may be attained using one or more of the following parameters in an electron spectroscopy method or system. The one or more parameters may include using low ion energy ions for removing material from the sample to expose progressively deeper layer ...