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Robert Senzig Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. Ziolkowski Patent Solutions Group, March 16, 2006: US20060056581-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


2
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. General Electric Company, Ziolkowski Patent Solutions Group SC, August 21, 2007: US07260174 (42 worldwide citation)

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


3
Robert Senzig
Hui David He, Hui Hu, Robert F Senzig, Gary R Strong, Guy M Besson, David M Hoffman, George E Seidenschnur, Armin H Pfoh, Jonathan A Murray, Thomas L Toth, Willi W Hampel: Scalable multislice imaging system. General Electric Company, Armstrong Teasdale, Christian G Cabou, Phyllis Y Price, March 6, 2001: US06198791 (20 worldwide citation)

The present invention is, in one aspect, an imaging system having a detector that has multiple detector cells extending along a z-axis, the detector being configured to collect multiple slices of data; and a scalable data acquisition system configured to convert signals from the detector to digital ...


4
Robert Senzig
David M Hoffman, Robert F Senzig, Stanley H Fox: Methods and apparatus for providing additional computed tomography imaging modes. GE Medical Systems Global Technology Company, Carl B Horton Esq, Armstrong Teasdale, May 14, 2002: US06389096 (9 worldwide citation)

In one aspect, the invention is a method for changing at least one of a number of image slices and in-plane resolutions available in an existing imaging system. The method includes steps of: replacing the existing detector array with a replacement detector array having either narrower detector cells ...


5
Robert Senzig
David M Hoffman, John Eric Tkaczyk, James W LeBlanc, Yanfeng Du, Robert F Senzig: Direct conversion energy discriminating CT detector with over-ranging correction. General Electric Company, Jason K Klindtworth, April 13, 2010: US07697659 (4 worldwide citation)

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


6
Robert Senzig
David M Hoffman, James Walter LeBlanc, John Eric Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. General Electric Company, Ziolkowski Patent Solutions Group SC, September 1, 2009: US07583790 (4 worldwide citation)

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


7
Robert Senzig
David M Hoffman, James W LeBlanc, John Eric Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. General Electric Company, Scott J Asmus, December 15, 2009: US07634060 (3 worldwide citation)

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


8
Robert Senzig
David M Hoffman, James W LeBlanc, John Eric Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating CT detector with over-ranging correction. General Electric Company, Jason K Klindtworth, August 4, 2009: US07570736 (1 worldwide citation)

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


9
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating ct detector with over-ranging correction. General Electric Company, Global Research, December 11, 2008: US20080304618-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...


10
Robert Senzig
David M Hoffman, James LeBlanc, John Tkaczyk, Robert F Senzig, Yanfeng Du: Direct conversion energy discriminating ct detector with over-ranging correction. General Electric Company, Global Research, October 25, 2007: US20070248209-A1

A CT detector capable of energy discrimination and direct conversion is disclosed. The detector includes multiple layers of semiconductor material with the layers having varying thicknesses. The detector is constructed to be segmented in the x-ray penetration direction so as to optimize count rate p ...



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