1
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Majestic Parsons Siebert & Hsue, August 12, 1997: US05657332 (492 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


2
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Majestic Parsons Siebert & Hsue, July 2, 1996: US05532962 (400 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


3
Daniel L Auclair, Eliyahou Harari: Mass computer storage system having both solid state and rotating disk types of memory. SanDisk Corporation, Majestic Parsons Siebert & Hsue, July 7, 1998: US05778418 (130 worldwide citation)

Solid-state flash electrically erasable and programmable read-only-memory ("flash EEPROM") system is combined with a rotating disk drive memory to provide mass program and data storage in a computer system. A common memory controller directs system generated memory addresses in a disk format to eith ...


4
Daniel L Auclair, Eliyahou Harari: Mass computer storage system having both solid state and rotating disk types of memory. SanDisk Corporation, Majestic Parsons Siebert & Hsue, January 18, 2000: US06016530 (61 worldwide citation)

Solid-state flash electrically erasable and programmable read-only-memory ("flash EEPROM") system is combined with a rotating disk drive memory to provide mass program and data storage in a computer system. A common memory controller directs system generated memory addresses in a disk format to eith ...


5
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. Zilog, Majestic Parsons Siebert & Hsue, April 11, 2000: US06049899 (41 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


6
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, November 10, 2009: US07616484 (31 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


7
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, November 23, 2010: US07839685 (13 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


8
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, October 14, 2008: US07437631 (4 worldwide citation)

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


9
Daniel L Auclair, Jeffrey Craig, John S Mangan, Robert D Norman, Daniel C Guterman, Sanjay Mehrotra: Soft errors handling in EEPROM devices. SanDisk Corporation, Davis Wright Tremaine, June 16, 2009: US07548461

Soft errors occur during normal use of a solid-state memory such as EEPROM or Flash EEPROM. A soft error results from the programmed threshold voltage of a memory cell being drifted from its originally intended level. The error is initially not readily detected during normal read until the cumulativ ...


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