1
John E Barth Jr, Charles E Drake, John A Fifield, William P Hovis, Howard L Kalter, Scott C Lewis, Daniel J Nickel, Charles H Stapper, James A Yankosky: Dynamic RAM with on-chip ECC and optimized bit and word redundancy. International Business Machines Corporation, Mark F Chadurjian, July 28, 1992: US05134616 (77 worldwide citation)

A DRAM having on-chip ECC and both bit and word redundancy that have been optimized to support the on-chip ECC. The bit line redundancy features a switching network that provides an any-for-any substitution for the bit lines in the associated memory array. The word line redundancy is provided in a s ...


2
Cheryl A Hoffman, Mark A Lavin, William Leipold, Kathleen McGroddy, Daniel J Nickel: Method and system using the design pattern of IC chips in the processing thereof. International Business Machines Corporation, Heslin & Rothenberg P C, September 3, 1996: US05552996 (24 worldwide citation)

The techniques of the present invention facilitate the control of an IC chip fabrication level of a fabrication process based upon the design pattern of the IC chip being fabricated. A grid having multiple sections is imposed over the design pattern of a fabrication level of the IC chip. Then, patte ...


3
Roy S Bass Jr, Daniel J Nickel, Daniel C Sullivan, Steven H Voldman: Method of automated ESD protection level verification. International Business Machines Corporation, Richard M Kotulak Esq, Whitham Curtis & Whitham, July 11, 2000: US06086627 (21 worldwide citation)

A integrated circuit (IC) chip with ESD protection level and the system and method of wiring the IC chip. Minimum wire width and maximum resistance constraints are applied to each of the chip's I/O ports. These constraints are propagated to the design and array pads are wired to I/O cells located on ...


4
William F DeCamp, Daniel J Nickel: IC design density checking method, system and program product. International Business Machines Corporation, Richard M Kotulak, Hoffman Warnick & D Alessandro, August 15, 2006: US07093212 (3 worldwide citation)

A system, method and program product for performing density checking of an IC design. The invention establishes an evaluation array for the IC design including an array element for each evaluation window of the IC design. The number of evaluation windows is based on a smallest necessary granularity. ...


5
John E Barth Jr, Charles E Drake, William P Hovis, Howard L Kalter, Gordon A Kelley Jr, Scott C Lewis, Daniel J Nickel, James A Yankosky: Low power addressing systems. International Business Machines Corporation, Stephen J Limanek, March 12, 1991: US04999815 (2 worldwide citation)

Low power addressing systems are provided which include a given number of memory segments, each having word and bit/sense lines, a given number of decoders coupled to the given number of memory segments for selecting one word line in each of the memory segments, a first plurality of transmission gat ...


6
Scott J Bukofsky, John K DeBrosse, Marco Hug, Lars W Liebmann, Daniel J Nickel, Juergen Preuninger: Layout impact reduction with angled phase shapes. International Business Machines Corporation, Infineon Technologies North America, DeLio & Peterson, Robert Curcio, Todd M C Li, November 14, 2006: US07135255

A phase shift mask shape that reduces line-end shortening at the critical feature without changing layout size increases required of requisite phase shift rules. The phase feature is given an angled extension, which includes the lithographic shortening value. This allows the critical shape to be des ...


7
Scott J Bukofsky, John K DeBrosse, Marco Hug, Lars W Liebmann, Daniel J Nickel, Juergen Preuninger: Layout impact reduction with angled phase shapes. International Business Machines Corporation, Infineon Technologies North America, Delio & Peterson, September 30, 2004: US20040191638-A1

A phase shift mask shape that reduces line-end shortening at the critical feature without changing layout size increases required of requisite phase shift rules. The phase feature is given an angled extension, which includes the lithographic shortening value. This allows the critical shape to be des ...


8
William F DeCamp, Daniel J Nickel: Ic design density checking method, system and program product. International Business Machines Corporation, Hoffman Warnick & D Alessandro, September 29, 2005: US20050216870-A1

A system, method and program product for performing density checking of an IC design. The invention establishes an evaluation array for the IC design including an array element for each evaluation window of the IC design. The number of evaluation windows is based on a smallest necessary granularity. ...



Click the thumbnails below to visualize the patent trend.