1
Nian Niles Yang, Chris Nga Yee Yip: Memory system temperature management. SanDisk Technologies, Brinks Gilson & Lione, December 5, 2017: US09837146

Systems, methods and/or devices are used to adjust a read property for a memory portion of non-volatile memory. In one aspect, in response to receiving a program request, the device: detects a first temperature of the memory portion; and stores first temperature data corresponding to the detected fi ...


2
Grishma Shah, Philip David Reusswig, Chris Nga Yee Yip, Nian Niles Yang: Program temperature aware data scrub. Western Digital Technologies, Vierra Magen Marcus, July 17, 2018: US10026483

Techniques disclosed herein cope with cross-temperature effects in non-volatile memory systems. One technology disclosed herein includes an apparatus and method that scrubs a block of non-volatile memory cells responsive to a determination that variance in word line program temperatures in the block ...


3
Philip Reusswig, Deepak Raghu, Zelei Guo, Chris Nga Yee Yip: Memory system with a weighted read retry table. SanDisk Technologies, Brinks Gilson & Lione, October 16, 2018: US10102920

A storage device with a memory may utilize an optimized read retry operation. A read retry table includes a number of read retry cases with updated read thresholds. The read thresholds in the read retry table may be used to avoid errors caused by shifting of charge levels. The optimization of read r ...


4
Deepak Raghu, Pao Ling Koh, Philip Reusswig, Chris Nga Yee Yip, Jun Wan, Yan Li: Adaptive temperature and memory parameter throttling. SanDisk Technologies, Brinks Gilson & Lione, June 26, 2018: US10007311

A storage device with a memory may modify throttling to reduce cross temperature effects. The decision to throttle may be based on a memory device temperature (i.e. temperature throttling) or may be based on the memory device's health, usage, or performance (e.g. hot count or bit error rate). Temper ...