1
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I du Pont de Nemours and Company, September 20, 2005: US06946410 (104 worldwide citation)

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


2
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I du Pont de Nemours and Company, February 14, 2006: US06998358 (54 worldwide citation)

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


3
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I Du Pont de Nemours And Company, Legal Patent Records Center, February 26, 2004: US20040038556-A1

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


4
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Anand Beyer Jagota, Steven Raymond Lustig, Rakesh H Mehta, Paula Beyer Hietpas, Bibiana Onoa: Method for providing nano-structures of uniform length. E I Du Pont de Nemours And Company, Legal Patent Records Center, April 14, 2005: US20050079666-A1

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.


5
Roger Harquail French, Timothy Gierke, Mark Andrew Harmer, Paula Beyer Hietpas, Anand Jagota, Steven Raymond Lustig, Rakesh Mehta, Bibiana Onoa: Method for providing nano-structures of uniform length. Ei Du Pont de Nemours And Company, E I Du Pont de Nemours And Company, Legal Patent Records Center, January 19, 2006: US20060014084-A1

This invention relates to the field of nanotechnology. Specifically the invention describes a method for cutting a multiplicity of nano-structures to uniform dimensions of length, length and width, or area, or to a specific distribution of lengths or area using various cutting techniques.



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