1
Arnold Halperin, Paul Andrew Moskowitz, Alejandro Gabriel Schrott, Charles P Tresser, Robert Jacob von Gutfeld: Method and system for preventing counterfeiting of high price wholesale and retail items. International Business Machines Corporation, Stephen C Kaufman Esq, McGinn & Gibb P C, May 1, 2001: US06226619 (140 worldwide citation)

A method and system for preventing counterfeiting of an item, include an interrogatable tag attached to the item. The item includes visible indicia for comparison with secret, non-duplicable information stored in the tag designating authenticity.


2
Leping Li, Steven G Barbee, Arnold Halperin, Tony F Heinz: In-situ monitoring of the change in thickness of films. International Business Machines Corporation, Alison D Mortinger, September 24, 1996: US05559428 (118 worldwide citation)

The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detected. With a conductive film, eddy currents are ...


3
Leping Li, Steven George Barbee, Arnold Halperin, Tony Frederick Heinz: In-situ monitoring and control of conductive films by detecting changes in induced eddy currents. International Business Machines Corporation, Alison D Mortinger, Jay H Anderson, June 6, 2000: US06072313 (75 worldwide citation)

The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detected. With a conductive film, eddy currents are ...


4
Arnold Halperin, Joseph D Rutledge, Alejandro Gabriel Schrott, Charles P Tresser, Robert Jacob von Gutfeld, Chai Wah Wu: Hand held telephone set with separable keyboard. International Business Machines Corporation, Stephen C Kaufman Esq, Whitham Curtis & Whitham, September 5, 2000: US06115616 (70 worldwide citation)

A detachable keyboard for a telephone set is provided in the form of a keyboard card clipped to the headset, which is completely detached from the body when unclipped. Wireless communication between the handset body and keyboard is used when the card is unclipped, while contacts are activated in the ...


5
Leping Li, Steven George Barbee, Arnold Halperin, Tony Frederick Heinz: In-situ monitoring of conductive films on semiconductor wafers. International Business Machines Corporation, Alison D Mortinger, August 26, 1997: US05660672 (66 worldwide citation)

The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detected. With a conductive film, eddy currents are ...


6
Leping Li, Steven George Barbee, Arnold Halperin: Endpoint detection for chemical mechanical polishing using frequency or amplitude mode. International Business Machines Corporation, Alison D Mortinger, July 1, 1997: US05644221 (59 worldwide citation)

A method and apparatus for endpoint detection in removal of a film from a semiconductor wafer is provided, with a sensor for creating a signal responsive to the film removal process, a positive feedback amplifier coupled to the sensor, the positive feedback amplifier having a mode selector, and an a ...


7
Thomas H Di Stefano, Arnold Halperin: Nonlinearity detection using fault-generated second harmonic. International Business Machines Corporation, Carl C Kling, January 29, 1985: US04496900 (50 worldwide citation)

The tester and method for nondestructively detecting nonlinearity faults in conductors includes the application of a composite AC and DC drive signal to the device under test in such manner that nonlinearities in the device under test produce fault signals including second harmonics, due to local ch ...


8
Leping Li, Steven George Barbee, Arnold Halperin, Tony Frederick Heinz: In-situ monitoring of the change in thickness of films. International Business Machines Corporation, Alison D Mortinger, March 24, 1998: US05731697 (46 worldwide citation)

The change in thickness of a film on an underlying body such as a semiconductor substrate is monitored in situ by inducing a current in the film, and as the thickness of the film changes (either increase or decrease), the changes in the current are detected. With a conductive film, eddy currents are ...


9
Leping Li, Steven George Barbee, Arnold Halperin: Chemical mechanical polishing endpoint process control. International Business Machines Corporation, Alison D Mortinger, August 19, 1997: US05659492 (31 worldwide citation)

A method and apparatus are provided for determining the endpoint for chemical mechanical polishing a film on a wafer. First, a reference point polishing time indicating when a breakthrough of the film has occurred is determined, then an overpolishing time indicating an interval between the reference ...


10
Leping Li, Steven George Barbee, Gary Richard Doyle, Arnold Halperin, Kevin L Holland, Francis Walter Kazak, Robert B Lipori, Anne Elizabeth McGuire, Rock Nadeau, William Joseph Surovic: Rotary signal coupling for chemical mechanical polishing endpoint detection with a westech tool. International Business Machines Corporation, Alison D Mortinger, September 2, 1997: US05663637 (20 worldwide citation)

Rotary signal coupling in in-situ monitoring of a chemical-mechanical polishing process. A sensor fixed to a rotatable wafer carrier for creating a signal responsive to the chemical mechanical polishing process is coupled to a bottom half of a rotary transformer fixed to a rotating portion of the po ...