Armand P Neukermans, Timothy G Slater: Micromachined torsional scanner. Donald E Schreiber, May 13, 1997: US05629790 (478 worldwide citation)

A frequency-locked torsional scanner of the type having a micromachined mirror formed on a surface of a silicon wafer section supported within a larger wafer section by a pair of opposed torsion bars. The principal vibrational frequency of the mirror is selected to be at least 20% higher than other ...

Michel J N Cormier, Avtar S Nat, Armand P Neukermans, Barry Block: Device for enhancing transdermal agent delivery or sampling. Alza Corporation, Owen J Bates, D Byron Miller, Steven F Stone, May 8, 2001: US06230051 (263 worldwide citation)

A percutaneous agent delivery or sampling device comprising a sheet having a plurality of microblades for piercing the skin for increasing transdermal flux of an agent. The microblades having a relatively sharp angled leading edge which transitions to a relatively gradually angled blade edge.

Herman F Kelderman, Michael E Fein, Alan E Loh, Arnold Adams, Armand P Neukermans: Confocal measuring microscope with automatic focusing. Tencor Instruments, Thomas Schneck, July 4, 1989: US04844617 (232 worldwide citation)

A confocal measuring microscope including a spectrometer and autofocus system sharing common optical elements in which the intensity of light entering the spectrometer from a particular spot on a workpiece is used to determine a focus condition for the same spot. The microscope includes at least one ...

Felix Theeuwes, Michel J N Cormier, Armand P Neukermans: Device and method for enhancing transdermal agent flux. Francis Law Group, July 19, 2005: US06918901 (153 worldwide citation)

An agent delivery or sampling device (2) comprising a member (6) having a plurality of blades (4) for piercing the skin and a connecting medium (65) covering at least a part of the skin contacting side (48) of the member (6) for increasing transdermal flux of an agent.

John L Vaught, Armand P Neukermans, Herman F Keldermann, Franklin R Koenig: Particle detection on patterned wafers and the like. Tencor Instruments, Thomas Schneck, February 6, 1990: US04898471 (141 worldwide citation)

A particle detection on a periodic patterned surface is achieved in a method and apparatus using a single light beam scanning at a shallow angle over the surface. The surface contains a plurality of identical die with streets between die. The beam scans parallel to a street direction, while a light ...

S George Lesinski, Armand P Neukermans, Christopher P Neukermans: Attaching an implantable hearing aid microactuator. Donald E Schreiber, September 14, 1999: US05951601 (139 worldwide citation)

A microactuator (32) of an implantable hearing aid system (10) is secured within a casing (50) implanted into a fenestration (52) that pierces the promontory (18) of the otic capsule bone (31). The casing (50) includes a hollow sleeve (62) that has an outer surface (64) and a first end (66) that is ...

Peter C Jann, Kenneth P Gross, Armand P Neukermans: Particle detector for rough surfaces. Tencor Instruments, Schneck & McHugh, February 23, 1993: US05189481 (139 worldwide citation)

A surface inspection apparatus having multiple inspection stations to inspect a wafer for a number of characteristics. The wafer is placed on a chuck connected to a rack-and-pinion or equivalent system so that the wafer simultaneously rotates and translates under the fixed position of the inspection ...

Armand P Neukermans, Timothy G Slater, Philip Downing: Micromachined members coupled for relative rotation by torsion bars. Xros, Donald E Schreiber, April 4, 2000: US06044705 (128 worldwide citation)

Two torsion bars project from a reference member to support at least one plate or frame-shaped first dynamic member for rotation about an axis of the torsion bars. In one embodiment, a frame-shaped first dynamic member and a second pair of torsion bars, oriented non-parallel to the first torsion bar ...

John L Vaught, Michael E Fein, Armand P Neukermans: Speckle reduction track filter apparatus for optical inspection of patterned substrates. Tencor Instruments, Schneck & McHugh, November 23, 1993: US05264912 (123 worldwide citation)

An apparatus used to inspect patterned wafers and other substrates with periodic features for the presence of particles, defects and other aperiodic features in which a spatial filter placed in the Fourier plane is used in combination with either broadband illumination, angularly diverse illuminatio ...

Armand P Neukermans, Timothy G Slater, Philip Downing: Compact, simple, 2D raster, image-building fingerprint scanner. Xros, Donald E Schreiber, September 19, 2000: US06122394 (112 worldwide citation)

A beam (38) of electromagnetic radiation deflected by a moving mirror plate (56) of a micromachined scanner (54) produces a two dimensional ("2D") raster (132) on a scanned surface (28) of a block (34). The block (34) is transparent to electro-magnetic radiation of pre-established wavelengths. A rad ...

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