1
Archibald J Allen, Wilm E Donath, Alan D Dziedzic, Mark A Lavin, Daniel N Maynard, Dennis M Newns, Gustavo E Tellez: Method for prediction random defect yields of integrated circuits with accuracy and computation time controls. International Business Machines Corporation, Richard M Kotulak Esq, McGinn & Gibb PLLC, May 18, 2004: US06738954 (58 worldwide citation)

A method of computing a manufacturing yield of an integrated circuit having device shapes includes sub-dividing the integrated circuit into failure mechanism subdivisions (each of the failure mechanism subdivisions includes one or more failure mechanism and each of the failure mechanisms includes on ...


2
Archibald J Allen, Jerome B Lasky, John J Pekarik, Jed H Rankin, Francis R White: Hot-electron programmable latch for integrated circuit fuse applications and method of programming therefor. International Business Machines Corporation, John J Goodwin, March 14, 2000: US06038168 (35 worldwide citation)

A method and apparatus for conditioning an integrated circuit to always enter a desired operating state when actuated by permanently altering at least one component device. An integrated circuit is provided with at least one component transistor wherein a constant high voltage is applied only once t ...


3
Archibald J Allen, Toshiharu Furukawa, Edward F O Neil, Mark C Hakey, Roger A Verhelst, David V Horak: Device contact structure and method for fabricating same. International Business Machines Corporation, Eugene I Shkurko, Schmeiser Olsen & Watts, July 18, 2000: US06090673 (2 worldwide citation)

The present invention overcomes the difficulties found in the background art by providing a direct low resistive contact between devices on a semiconductor chip without excessive current leakage. Current leakage is prevented in the preferred design by using silicon on insulator (SOI) construction fo ...


4
Archibald J Allen, Orest Bula, John M Cohn, Daniel Cole, Edward W Conrad, William C Leipold: Optical Proximity Correction Structures Having Decoupling Capacitors. International Business Machines Corporation, Richard A Henkler Esq, McGinn & Gibb PLLC, August 6, 2002: US06429469 (2 worldwide citation)

A structure for a semiconductor chip which includes a first region having first cells for storing and processing data, and a second region outside the first region having OPC structures, wherein the OPC structures comprise decoupling capacitors. The line widths of the active gates of first cells are ...