1
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, November 9, 2004: US06815963 (65 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


2
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 9, 2007: US07161363 (36 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


3
Hazem Mahmoud Hegazy, Amr M E Safwat, Wael Fikry Farouk Fikry Abdalla: Test structures and method for interconnect impedance property extraction. Klarquist Sparkman, March 4, 2008: US07340703 (15 worldwide citation)

A method and test structures are disclosed for characterizing interconnects of an integrated circuit. The method provides a set of test structures and determines a unit impedance property of each test structure, desirably using S-parameter measurements. A reference impedance data set is then formula ...


4
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for high-frequency testing of a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, December 4, 2007: US07304488 (11 worldwide citation)

A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a sec ...


5
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, April 14, 2009: US07518387 (5 worldwide citation)

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


6
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, January 27, 2009: US07482823 (5 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and ...


7
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe with low contact resistance for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, October 14, 2008: US07436194 (5 worldwide citation)

A probe measurement system having low, stable contact resistance for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


8
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Shielded probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer McClung & Stenzel, February 10, 2009: US07489149 (4 worldwide citation)

A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal oath and ...


9
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Chernoff Vilhauer Mcclung & Stenzel, November 25, 2004: US20040232927-A1

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.


10
K Reed Gleason, Tim Lesher, Eric W Strid, Mike Andrews, John Martin, John Dunklee, Leonard Hayden, Amr M E Safwat: Probe for testing a device under test. Cascade Microtech, Chernoff Vilhauer Mcclung & Stenzel, April 5, 2007: US20070075716-A1

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.