Private Ugochukwu Njoku
John R Flanagan, Daniel F Casper, Matthew J Kalos, Dale F Riedy, Gustav E Sittmann, Ugochukwu C Njoku, Catherine C Huang: Providing indirect data addressing for a control block at a channel subsystem of an I/O processing system. International Business Machines Corporation, Cantor Colburn, John Campbell, February 14, 2012: US08117347

An computer program product, apparatus, and method for facilitating input/output (I/O) processing for an I/O operation at a host computer system configured for communication with a control unit. The computer program product includes a tangible storage medium readable by a processing circuit and stor ...

James Kraemer Ph.D.
Robert Lee Angell, Robert R Friedlander, James R Kraemer: Generating predilection cohorts. Nuance Communications, Wolf Greenfield & Sacks P C, February 14, 2012: US08117144 (16 worldwide citation)

A computer implemented method, apparatus, and computer program product for generating risk scores for specific risk cohorts. Digital sensor data associated with a specific risk cohort is received from a set of multimodal sensors. The specific risk cohort includes a set of identified cohort members. ...

Erwin Meinders
Martijn Henri Richard Lankhorst, Erwin Rinaldo Meinders, Robertus Adrianus Maria Wolters, Franciscus Petrus Widdershoven: Electric device comprising phase change material. NXP, February 14, 2012: US08115239 (3 worldwide citation)

The electric device according to the invention has a resistor comprising a layer of a phase change material which is changeable between a first phase with a first electrical resistivity and a second phase with a second electrical resistivity different from the first electrical resistivity. The phase ...

Belgacem Haba Belgacem (Bel) Haba
Vage Oganesian, Guilian Gao, Belgacem Haba, David Ovrutsky: Microelectronic assemblies having compliancy and methods therefor. Tessera, Lerner David Littenberg Krumholz & Mentlik, February 14, 2012: US08115308 (1 worldwide citation)

A microelectronic assembly is disclosed that includes a semiconductor wafer with contacts, compliant bumps of dielectric material overlying the first surface of the semiconductor wafer, and a dielectric layer overlying the first surface of the semiconductor wafer and edges of the compliant bumps. Th ...

Brian Goodall
Edmund Elce, Takashi Hirano, Jeffrey C Krotine Jr, Larry F Rhodes, Brian L Goodall, SaiKumar Jayaraman, W Chris McDougall, Shenliang Sun: Photosensitive compositions based on polycyclic polymers. Sumitomo Bakelite Company, The Webb Law Firm, February 14, 2012: US08114948

A copolymer composition including a copolymer having repeat units of structural formula I: where X is selected from —CH2—, —CH2—CH2— and O; m is an integer from 0 to 5; and each occurrence of R1-R4 are independently selected from H; C1 to C25 linear, branched, and cyclic alkyl, aryl, aralkyl, alkary ...

sally liu
Chia Chung Chen, Shuo Mao Chen, Chin Wei Kuo, Sally Liu: Four-terminal gate-controlled LVBJTs. Taiwan Semiconductor Manufacturing Company, Slater & Matsil L, February 14, 2012: US08115280 (61 worldwide citation)

An integrated circuit structure includes a well region of a first conductivity type, an emitter of a second conductivity type opposite the first conductivity type over the well region, a collector of the second conductivity type over the well region and substantially encircling the emitter, and a ba ...

sally liu
Yih Yuh Doong, Keh Jeng Chang, Yuh Jier Mii, Sally Liu, Lien Jung Hung, Victor Chih Yuan Chang: Accurate capacitance measurement for ultra large scale integrated circuits. Taiwan Semiconductor Manufacturing Company, Slater & Matsil L, February 14, 2012: US08115500 (3 worldwide citation)

Test structures and methods for measuring contact and via parasitic capacitance in an integrated circuit are provided. The accuracy of contact and via capacitance measurements are improved by eliminating not-to-be-measured capacitance from the measurement results. The capacitance is measured on a ta ...


Moody Hadi
Muhammed Hadi, Dale Michaels, Amy Stephen, Ketan Patel: Conversion of over-the-counter swaps to standardized forward swaps. Chicago Mercantile Exchange, Brinks Hofer Gilson & Lione, February 14, 2012: US08117110

Systems, processes and methods are described for converting over-the-counter derivative products such as interest rate swaps (IRSs) to standardized forward swaps, such as centrally cleared interest rate swaps. The value of each leg of the over-the counter swap may be determined and compared to a val ...