Private Ugochukwu Njoku
Harry M Yudenfriend, Scott M Carlson, Daniel F Casper, John R Flanagan, Roger G Hathorn, Catherine C Huang, Matthew J Kalos, Ugochukwu C Njoku, Louis W Ricci, Dale F Riedy, Gustav E Sittmann: Computer command and response for determining the state of an I/O operation. International Business Machines Corporation, Cantor Colburn, John Campbell, March 8, 2011: US07904605

A computer program product, apparatus, and method are provided for determining a state of an input/output (I/O) operation in an I/O processing system. A request from a channel subsystem is received at a control unit for performing the I/O operation. After a predetermined amount of time passes withou ...

Belgacem Haba Belgacem (Bel) Haba
Belgacem Haba, Ilyas Mohammed, Vage Oganesian, David Ovrutsky, Laura Wills Mirkarimi: Reconstituted wafer level stacking. Tessera, Lerner David Littenberg Krumholz & Mentlik, March 8, 2011: US07901989 (83 worldwide citation)

A stacked microelectronic assembly is fabricated from a structure which includes a plurality of first microelectronic elements having front faces bonded to a carrier. Each first microelectronic element may have a first edge and a plurality of first traces extending along the front face towards the f ...

Ulrich Klostermann
Dietmar Gogl, Rainer Leuschner, Ulrich Klostermann: Integrated circuit, memory cell array, memory module, and method of operating an integrated circuit. Qimonda, ALTIS Semiconductor SNC, March 8, 2011: US07903454 (7 worldwide citation)

According to one embodiment of the present invention, an integrated circuit includes a plurality of thermal selectable memory cells, each memory cell being connected to a conductive line, the conductive line having a first portion for applying a heating current, and a second portion for applying a p ...

Eb Eshun
Anil K Chinthakindi, Douglas D Coolbaugh, John M Cotte, Ebenezer E Eshun, Zhong Xiang He, Anthony K Stamper, Eric J White: Integrated BEOL thin film resistor. International Business Machines Corporation, Anthony J Canale, March 8, 2011: US07902629 (5 worldwide citation)

In the course of forming a resistor in the back end of an integrated circuit, an intermediate dielectric layer is deposited and a trench etched through it and into a lower dielectric layer by a controllable amount, so that the top of a resistor layer deposited in the trench is close in height to the ...

Ulrich Klostermann
Ulrich Klostermann, Franz Kreupl: Integrated circuit having a magnetic tunnel junction device and method. Qimonda, Dicke Billig & Czaja PLLC, March 8, 2011: US07902616 (4 worldwide citation)

An integrated circuit having a magnetic tunnel junction and method. One embodiment provides an integrated circuit having a magnetic tunnel junction is provided. The magnetic tunnel junction includes a barrier layer. The barrier layer includes carbon, pyrolytic carbon, or graphene, or graphite.

Ulrich Klostermann
Rok Dittrich, Ulrich Klostermann: Magnetoresistive memory cell. Qimonda, Altis Semiconductor SNC, March 8, 2011: US07903452 (3 worldwide citation)

A magnetoresistive memory cell has a magnetic stack providing an effective anisotropy field of a storage layer of the magnetic stack during thermal select heating, at least one line providing at least one external magnetic field to the magnetic stack, the effective anisotropy field and the at least ...

Katsuyuki Musaka
Natsuki Makino, Keisuke Namiki, Kunihito Ide, Junji Kunisawa, Katsuyuki Musaka: Plating apparatus. Ebara Corporation, Wenderoth Lind & Ponack L, March 8, 2011: US07901550 (2 worldwide citation)

A plating apparatus can form a plated film having a uniform thickness over the entire surface of a substrate without a change of members. The plating apparatus includes a substrate holder, a cathode contact for contacting a conductive film formed on the substrate so that the conductive film serves a ...

Greg LaBonte
Emilio Miguelanez, Michael J Scott, Greg LaBonte: Methods and apparatus for data analysis. Test Advantage, The Noblitt Group PLLC, March 8, 2011: US07904279 (1 worldwide citation)

Methods and apparatus for data analysis according to various aspects of the present invention identify statistical outliers in data, such as test data for components. The outliers may be identified and categorized according to the distribution of the data. In addition, outliers may be identified acc ...