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Fred Thomas Fred Thomas
Thomas Fred C Iii: Rf id tagging for improved tracking in maintenance environment. Iomega, September 21, 2001: JP2001-256448 (4 worldwide citation)

PROBLEM TO BE SOLVED: To provide a device and a method for tracking an object inside a maintenance environment.SOLUTION: RF ID technique including a tag and an antenna is adopted and the antenna is arranged at a strategic position inside maintenance environment such as a safe. An RF ID tag has a mem ...


2
Yamamoto Yuichi: Method and device for laminating substrate and method and device for manufacturing liquid crystal display device. Sharp, September 21, 2001: JP2001-255542 (197 worldwide citation)

PROBLEM TO BE SOLVED: To provide a method for laminating substrates and a device for lamination, in which the pressing force between two substrates can be applied uniformly over the whole substrate, without having to use a precision press mechanism and precision lamination of substrates can be readi ...


3
Yokoi Tetsuya: Semiconductor device, its manufacture and ic card communication system. Toshiba, September 21, 2001: JP2001-256457 (123 worldwide citation)

PROBLEM TO BE SOLVED: To provide a non-contact IC card whose manufacturing process is simplified and whose conductive resistance can be made small, an RFID device (radio frequency identification) used for a TAG for physical distribution, etc., and its manufacturing method.SOLUTION: An antenna coil 1 ...


4
Kurata Keiko, Fukao Ryuzo: Semiconductor device. Hitachi Maxell, September 21, 2001: JP2001-257292 (86 worldwide citation)

PROBLEM TO BE SOLVED: To provide a semiconductor device wherein corrosion of an antenna material inside and/or deformation or damage of an antenna coil portion hardly occur.SOLUTION: This semiconductor device is constructed by forming an antenna coil for radio communication electrically connected wi ...


5
Kikuchi Minoru: System and method for judging target. Toshiba, September 21, 2001: JP2001-256500 (63 worldwide citation)

PROBLEM TO BE SOLVED: To provide a target judging system with high performance by performing a processing at higher speed and improving processing precision even when multiple similar objects (object candidates) exist and also an environmental change is intense.SOLUTION: A target judging system for ...


6
Usuda Koji, Tezuka Tsutomu, Mizuno Tomohisa, Hatakeyama Tetsuo, Sugiyama Naoharu, Takagi Shinichi: Semiconductor device and its manufacturing method. Toshiba, September 21, 2001: JP2001-257351 (51 worldwide citation)

PROBLEM TO BE SOLVED: To provide a structure for forming a semiconductor element of high performance at a low cost and its manufacturing method by applying selectively sufficient strain to a channel layer in a desired semiconductor element alone, according to required element characteristic without ...


7
Yoshida Hiroichi: Decorative floor members for building and manufacturing method therefor. Toyo Tex, September 21, 2001: JP2001-254503 (46 worldwide citation)

PROBLEM TO BE SOLVED: To provide floor members for a building having pleasant walkability and good design performance which can be manufactured a low cost material for finish floor members and a manufacturing method therefor.SOLUTION: A plurality of finish veneers 2 are adhered to the top of a base ...


8
Kuno Yoshiki, Wada Hiroshi, Ayaki Yasushi, Goto Shoichi, Yanagisawa Reigo: Program recorder, medium and information aggregate. Matsushita Electric, September 21, 2001: JP2001-257950 (44 worldwide citation)

PROBLEM TO BE SOLVED: To solve a problem that the program of recording which has been reserved before the recording reservation of a new program cannot be performed since recording of the new program is reserved.SOLUTION: This device is provided with a medium control part 60 for writing and erasing ...


9
Kido Junji, Ebisawa Akira: Organic el element. TDK, Kido Junji, September 21, 2001: JP2001-257076 (43 worldwide citation)

PROBLEM TO BE SOLVED: To realize an organic EL element which enables to achieve reliability of thermal stability and the like and high efficiency in the high brightness region at the same time by doping a triplet luminous material in an organic host material, particularly, in a non-conjugated unsatu ...


10
Ide Satoru, Tanaka Kiyoshi, Ito Toshihiro: Wafer polishing stop detection method and polishing stop detection device. Nikon, September 21, 2001: TW455938 (35 worldwide citation)

A wafer polishing stop detection method and polishing stop detection device which provides the method for detecting CMP polishing stop by polishing surface status index of polishing wafer in more precision. The solution of the wafer polishing stop detection method is irradiating the light from the l ...



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