1
Yoichiro Ito: Flow-through centrifuge. The United States of America represented by the Department of Health and Human Services, Joseph A Hill, Thomas J Byrnes, William O Geny, January 10, 1984: US04425112 (136 worldwide citation)

A flow-through centrifuge free of rotating seals. The centrifuge includes a frame having three spaced apart horizontal plates which carry a central bowl, a countershaft and a tube-supporting hollow shaft. A motor is arranged to drive the frame at an angular velocity of .omega.. The countershaft is d ...


2
Raymond S Enochs: Pressure interconnect package for integrated circuits. Tektronix, John D Winkelman, John Smith Hill, William O Geny, July 1, 1986: US04597617 (99 worldwide citation)

A pressure interconnect package for connecting an integrated circuit chip to an etched circuit board comprising a pressurized stack of circuit elements in which a flexible interconnecting circuit is disposed between the IC chip and the etched circuit board to cause them to make electrical contact up ...


3
Matthew J Hadwin, John D Garcia, Emory J Harry: Telescoping pin probe. Tektronix, William O Geny, George T Noe, April 19, 1988: US04739259 (95 worldwide citation)

A probe for use in electrical circuit test equipment, in which a contact element is longitudinally slidable in an insulator sleeve which also contains an R-C attenuator circuit connected electrically to the contact element by an electrically conductive elastomeric material. A high impedance cable is ...


4
Emory J Harry, Matthew J Hadwin, John D Garcia: Wideband high impedance card mountable probe. Tektronix, William O Geny, Francis I Gray, November 8, 1988: US04783625 (90 worldwide citation)

An active electrical test probe with wideband frequency capability for use on a test probe card, along with other test probes. A small hybrid integrated circuit is mounted on a substrate held on edge, adjacent the probe tip contact element of the probe, by a conductive metal clip. The circuit is pro ...


5
Steven K Sullivan, Christopher W Branson: Adjustable impedance driver network. Tektronix, William O Geny, Robert S Hulse, November 17, 1987: US04707620 (75 worldwide citation)

A variable impedance driver network comprises a plurality of transmission gates connected in parallel between a voltage source and an output. Each transmission gate has a predetermined nominal impedance and by turning on selective gates the overall impedance of the network may be adjusted to match t ...


6
H Erwin Grellman, Carl W Laakso, John J Reagan, Leonard A Roland: Coplanar microstrap waveguide interconnector and method of interconnection. Tektronix, Francis I Gray, William O Geny, July 15, 1986: US04600907 (57 worldwide citation)

An electrical connection between two semiconductor devices employs a coplanar microstrap waveguide comprising a plurality of thin straps of conductive metal embedded in a polyimide substrate and dimensioned to exhibit the properties of a coplanar waveguide. The waveguide structure provides the prope ...


7
Agoston Agoston, Robert G Sparkes: Clock recovery digital phase-locked loop. Tektronix, William O Geny, Robert S Hulse, July 14, 1987: US04680780 (38 worldwide citation)

A digital phase-locked loop circuit for recovering an external clock signal from an input serial data stream includes an up/down counter responsive to both the serial data stream and to the clock pulse output of a variable divider driven by an external clock. The up/down counter counts in a directio ...


8
Donald F Murray, Steven K Sullivan: Calibrated automatic test system. Tektronix, William O Geny, Allston L Jones, Robert S Hulse, February 9, 1988: US04724378 (28 worldwide citation)

A calibrated automatic test system includes a test station for generating digital test function codes and a test head containing a plurality of I/O pins for connection to a device under test. Each I/O pin includes a pin electronics circuit responsive to the digital test function codes for providing ...


9
H Erwin Grellmann, Leonard A Roland: Impedance match connection using multiple layers of bond wires. Tektronix, William O Geny, Francis I Gray, August 11, 1987: US04686492 (27 worldwide citation)

A bond wire connection between two semiconductor devices alleviates the problem of inductive loading at high frequencies by providing a capacitive effect which compensates for inductive reactance. The capacitive effect is provided by utilizing multiple parallel layers of bond wires at a common elect ...


10
Agoston Agoston, John B Rettig, Stanley P Kaveckis, John E Carlson, Andrew E Finkbeiner: Dual channel time domain reflectometer. Tektronix, William O Geny, Robert S Hulse, July 5, 1988: US04755742 (26 worldwide citation)

A dual channel time domain reflectometer includes a pair of input lines connected at respective nodes to a reference flat current pulse generator and a traveling wave sampling gate, respectively. The sampling gates are actuated by a balanced strobe generator which includes a waveguide coupler for co ...