41
Clifford E Baker: Electronic measurement instrument probe accessory offset, gain, and linearity correction method. Tektronix, Boulden G Griffith, William K Bucher, November 20, 2001: US06321171 (20 worldwide citation)

A correction method for an electronic instrument accessory probe utilizes an error correction equation wherein at least one term contains an exponent less than unity. One simple such equation is: S=Cs


42
Marc A Gessford, Mark W Nightingale, Gary W Reed: Probe tip adapter for a measurement probe. Tektronix, William K Bucher, June 4, 2002: US06400167 (20 worldwide citation)

A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile s ...


43
Mark W Nightingale, R Kenneth Price, William Q Law: Variable spacing probe tip adapter for a measurement probe. Tektronix, William K Bucher, June 11, 2002: US06404215 (20 worldwide citation)

A variable spacing probe tip adapter for a differential measurement probe has a measurement probe head with first and second probe tips extending from the probe head. Ribs and grooves formed in the probe head that extend radially from around each of the probe tips. Each of first and second first pro ...


44
Josef L Mader, Richard I Lane, Ronald J Bremer, Matthew Harcourt, Glenn Bateman: Expansion windowing system for a measurement test instrument. Tektronix, William K Bucher, July 14, 1992: US05129722 (19 worldwide citation)

A system for expanding a waveform in a measurement test instrument has a display area containing a waveform representative of data acquired by a measurement test instrument and an active movable cursor intersecting the waveform. The system has first and second viewports with the first viewport displ ...


45
Marc A Gessford, Mark W Nightingale, Gary W Reed: Probe tip adapter for a measurement probe. Tektronix, William K Bucher, August 5, 2003: US06603297 (19 worldwide citation)

A probe tip adapter for a measurement probe has at least a first electrically conductive element with a bore at one end and a probing contact formed on the other end. The bore of the electrically conductive element has an electrically conductive elastomer disposed therein having sufficient tensile s ...


46
Mark W Nightingale: Strain relief, pull-strength termination with controlled impedance for an electrical cable. Tektronix, William K Bucher, January 16, 2001: US06175080 (18 worldwide citation)

A strain relief and pull-strength termination with controlled impedance for a transmission cable has a carrier with a flat portion for accepting one end of the cable and tabs extending from the flat portion. The cable is secured to the flat portion via soldering of the shielding conductor to the fla ...


47
Gary W Reed, Jim L Martin, William R Pooley, William A Hagerup: Attachable/detachable variable spacing probing tip system. Tektronix, William K Bucher, November 22, 2005: US06967473 (18 worldwide citation)

An attachable/detachable variable spacing probing tip system has a housing that receives pivoting probing arms. Each probing arm has a support member and a probing arm portion of a flexible substrate having a conductive trace thereon. One end of each conductive trace is coupled to a probing contact ...


48
Clifford E Baker: Current probe. Tektronix, William K Bucher, December 19, 1995: US05477135 (18 worldwide citation)

A current probe comprising a Hall device and a secondary winding in a flux linking relationship with a magnetic circuit is self-calibrated by disconnecting the Hall device from the winding, passing a current through the winding so as to induce a magnetic flux in the magnetic circuit, measuring volta ...


49
Keith A Pope: Apparatus for connecting an IC device to a test system. Tektronix, William K Bucher, February 26, 1991: US04996478 (18 worldwide citation)

An apparatus for connecting an integrated circuit, IC, device to a test system has a first circuit board on which the IC device is mounted. The circuit board has an analog transmission line interposed between and electrically isolated from digital transmission lines on opposed surfaces of the circui ...


50
Douglas M Boudon: Support structure. Tektronix, John P Dellett, William K Bucher, Robert S Hulse, September 5, 1989: US04864469 (18 worldwide citation)

An integrated support structure provides for improved mounting of components such as circuit boards, disk drives, power supplies, and the like. The structure includes an upper frame and a lower frame hinged together and having cooperative elements for capturing components therebetween as the upper f ...