1
Patricia A Dwyer: Automated query optimization method using both global and parallel local optimizations for materialization access planning for distributed databases. Honeywell Bull, William A Linnell, George Grayson, John S Solakian, September 6, 1988: US04769772 (295 worldwide citation)

In a Distributed Database System (DDS), database management and transaction management are extended to a distributed environment among a plurality of local sites which each have transaction server, file server, and data storage facilities. The Materialization and Access Planning (MAP) method of a di ...


2
Daniel A Boudreau, James M Sandini, Edward R Salas: Lockout operation among asynchronous accessers of a shared computer system resource. Honeywell Information Systems, William A Linnell, George Grayson, John S Solakian, May 6, 1986: US04587609 (111 worldwide citation)

A data processing system having a plurality of units includes a shareable unit which is shareable between two or more of the other units. Lock apparatus is provided in the shareable unit to allow a first unit to lock the shareable unit so that no other unit attempting to lock the shareable unit will ...


3
Ming T Miu, John J Bradley: Program counter stacking method and apparatus for nested subroutines and interrupts. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, December 11, 1984: US04488227 (89 worldwide citation)

A computer system which facilitates the execution of nested subroutines and interrupts is disclosed. As each branch transfer within the program is executed by a control area logic, a microcommand initiates the transfer of the return address, which has been derived from the address in the present rou ...


4
Robert J Russell: Automatic test equipment test probe contact isolation detection method. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, August 3, 1982: US04342958 (70 worldwide citation)

A method for determining whether test probes of a test fixture on an automatic test equipment (ATE) device are in contact with the intended test points on an electronic assembly under test. The undetected failure of the test probes to contact the test points on the electronic assembly test, such as ...


5
Melinda A Widen, John J Bradley, George M O Har: Nibble and word addressable memory arrangement. Honeywell Information Systems, William A Linnell, George Grayson, John S Solakian, August 5, 1986: US04604695 (61 worldwide citation)

Apparatus is provided for addressing a memory by word and by one of a number of nibbles within a word, with the ability to increment or decrement nibble and word addresses and thereby access adjacent nibbles and words without having to generate new nibble and word addresses. An initial word address ...


6
David B O Keefe, Robert C Miller: Display video generation system for modifying the display of character information as a function of video attributes. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, May 28, 1985: US04520356 (57 worldwide citation)

A video generation logic for a display controller includes a precoded PROM which combines visual attributes associated with the characters of information to be displayed on the display screen to produce multiple video control signals for modifying the dot pattern generation signal which is generated ...


7
Daniel A Boudreau: Data processing system common bus utilization detection logic. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, March 5, 1985: US04503495 (53 worldwide citation)

A common bus utilization detection logic that is used when a particular device connected to a common bus has been granted access to the common bus wherein bus access is granted on a priority basis. By positioning the bus utilization logic in priority positions on the common bus adjacent to the parti ...


8
Robert C Beauchesne, Robert J Russell: Embedded memory testing method and apparatus. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, November 6, 1984: US04481627 (50 worldwide citation)

A method for testing memory arrays embedded within electronic assemblies having other combinatorial logic elements connected to the inputs thereof. By following stated design rules, the embedded memory can be isolated from the combinatorial logic element and tested by use of a memory test subsystem ...


9
Daniel A Boudreau, Edward R Salas: Priority resolver having dynamically adjustable priority levels. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, January 8, 1985: US04493036 (50 worldwide citation)

A data processing system including a dual ported main memory that can be accessed by I/O controllers via a common bus or directly by the central processing unit. The main memory is comprised of a volatile RAM array that requires periodic refreshing to prevent loss of information. Access to the main ...


10
Daniel A Boudreau: Data processing system auto address development logic for multiword fetch. Honeywell Information Systems, William A Linnell, Nicholas Prasinos, April 16, 1985: US04511960 (49 worldwide citation)

An auto address development logic that, when provided a starting address, is used to develop consecutive addresses as multiple words of information are presented, one word at a time, during multiple consecutive information transfer cycles. The logic retains for use a current address while simultaneo ...



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