1
Larry J Hornbeck: Spatial light modulator and method. Texas Instruments Incorporated, Carlton H Hoel, Robert O Groover, James T Comfort, January 28, 1986: US04566935 (489 worldwide citation)

Methods of fabrication of spatial light modulators with deflectable beams by plasma etching after dicing of a substrate into chips, each of the chips an SLM, is disclosed. Also, various architectures available with such plasma etching process are disclosed and include metal cloverleafs for substrate ...


2
Larry J Hornbeck: Linear spatial light modulator and printer. Texas Instruments Incorporated, Carlton H Hoel, Robert O Groover, James T Comfort, June 24, 1986: US04596992 (393 worldwide citation)

A linear spatial light modulator with two offset rows of pixels for slight overlap of images, and a printer system using such a spatial light modulator with dark field projection optics is disclosed. The pixels include electrostatically deflectable elements which all bend in the same direction to pe ...


3
Larry J Hornbeck, William E Nelson, James T Carlo: Deformable mirror electrostatic printer. Texas Instruments Incorporated, Carlton H Hoel, Robert O Groover, James T Comfort, February 18, 1986: US04571603 (352 worldwide citation)

An image projection system for producing a projected image in response to electrical signals which represent the image to be projected. The projection system includes input capability to produce electrical signals in response to an image to be projected. These electrical signals are then transmitted ...


4
Lee R Reid, Tommy D Cody: Solid state multiprobe testing apparatus. Texas Instruments Incorporated, Carlton H Hoel, Robert O Groover, James T Comfort, April 29, 1986: US04585991 (176 worldwide citation)

A high density multiprobe including a multiprobe on a semiconductor substrate with contact pads selectively positioned in relation to the contacts of a device to be tested. Each of the selectively positioned contacts on the multiprobe semiconductor substrate include an elevated conductive surface th ...


5
Satish M Thatte: Universal testing circuit and method. Texas Instruments Incorporated, Kenneth C Hill, Robert O Groover, James T Comfort, June 10, 1986: US04594711 (73 worldwide citation)

A test circuit, called a universal testing block (UTB) for on-chip testing of a VLSI subsystem such as a ROM or an ALU has several modes, including test generator and test evaluator, formed on the VLSI chip. The test generator circuit includes means for applying a predetermined test pattern to an in ...


6
Perry A Penz: Stacked electro-optic display. Texas Instruments Incorporated, Robert O Groover III, Melvin Sharp, James T Comfort, December 14, 1982: US04364039 (68 worldwide citation)

A visual display and method for producing the same. A plurality of electro-optic cells, such as liquid crystal cells, are placed in an optical series. Each of the cells receives approximately simultaneous identical signals. Due to the series relationship, the resulting contrast ratio will be signifi ...


7
David Robert Baldwin, Simon James Moore: 3D graphics rendering with selective read suspend. 3DLABS, Groover & Holmes, Robert O Groover, Patrick C R Holmes, December 20, 2005: US06977649 (50 worldwide citation)

A system and method for increasing rendering efficiency in pipelined graphics systems. In the disclosed embodiments, reads of pixel information during the rendering of a primitive are suspend if the pixel information has not been updated by a previous primitive. In some embodiments, reads of pixel i ...


8
Chi K Lau: Method of forming a titanium disilicide. Texas Instruments Incorporated, Kenneth C Hill, Robert O Groover, James T Comfort, October 8, 1985: US04545116 (50 worldwide citation)

A method of forming a metallic silicide on silicon or polysilicon in which a masking layer such as silicon dioxide is formed on a silicon slice and patterned to expose selected areas of the slice surface. The slice is then sputter etched followed by in situ deposition of a metal layer. The slice is ...


9
Satish M Thatte, Thirumalai Sridhar, David S Ho, Han Tzong Yuan, Theo J Powell: Architecture and method for testing VLSI processors. Texas Instruments Incorporated, Kenneth C Hill, Robert O Groover, James T Comfort, June 24, 1986: US04597080 (48 worldwide citation)

A method and apparatus for testing VLSI processors using a bit-sliced bus-oriented data path include data and control monitors and BIT for the on-chip memory. The data monitor is used to compress output data produced by the data path. BIT implementation of a functional test coupled with the data mon ...


10
James H Cline, David M Chastain: Memory system using pipeline circuitry for improved speed. Texas Instruments Incorporated, Kenneth C Hill, Robert O Groover, James T Comfort, June 24, 1986: US04597061 (47 worldwide citation)

A memory apparatus including an array of storage elements connected to a plurality of addressing lines for selectively connecting a group of storage elements to a plurality of data lines. Control circuitry is also provided that is connected to the array for regulating the reading and writing of data ...