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January Kister: Knee probe having reduced thickness section for control of scrub motion. Micro Porbe, Samantha A Updegraff, Deborah A Oeacock, Robert Lodenkamper, February 9, 2010: US07659739 (20 worldwide citation)

An improved knee probe for probing electrical devices and circuits is provided. The improved knee probe has a reduced thickness section to alter the mechanical behavior of the probe when contact is made. The reduced thickness section of the probe makes it easier to deflect the probe vertically when ...


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January Kister: Vertical guided probe array providing sideways scrub motion. MicroProbe, Deborah A Peacock, Samantha A Updegraff, Robert Lodenkamper, March 2, 2010: US07671610 (16 worldwide citation)

Improved probing of closely spaced contact pads is provided by an array of guided vertical probes that has a sideways scrub relative to the line of contact pads. With this orientation of scrub motion, the probes can be relatively thin along the contact line, and relatively thick perpendicular to the ...