1
Vahe′ A Adamian, Peter V Phillips, Patrick J Enquist: Method and apparatus for calibrating a multiport test system for measurement of a DUT. Agilent Technologies, June L Bouscaren, July 19, 2005: US06920407 (90 worldwide citation)

A method and apparatus for measuring a multiport device using a multiport test set connects one port of the multiport device to a stimulus signal and terminates all remaining ports in a respective load. A response to a stimulus signal is measured on all ports of the multiport device and the measured ...


2
William R Trutna Jr, Geraint Owen, Alan B Ray, James Prince, Eric Stephen Johnstone, Miao Zhu, Leonard S Cutler: Littrow interferometer. Agilent Technologies, June L Bouscaren, October 21, 2008: US07440113 (13 worldwide citation)

An apparatus and method for measuring displacement includes a light beam directed to an interferometer core that splits the light beam into first and second component beams. The first component beam is directed to a diffraction grating at approximately a Littrow angle. A diffraction is received by t ...


3
Jason T Gentry, David D Balhiser, Ronald G Harber, Bryan Haskin, Gayvin E Stong, Paul J Marcoux: Process and system for identifying wires at risk of electromigration. Agilent Technologies, June L Bouscaren, February 15, 2005: US06857113 (13 worldwide citation)

A method and system of identifying one or more nets in a digital IC design that are at risk of electromigration comprises selecting a manufacturing process for the digital IC design and obtaining a clock period and process voltage. A voltage waveform transition time and effective capacitance is calc ...


4
James B McKim Jr, John W Hyde, Marko Vulovic, Buck H Chan, John F Kenny, Richard A Carlson: Communications system for implementation of synchronous, multichannel, galvanically isolated instrumentation devices. Agilent Technologies, June L Bouscaren, November 27, 2007: US07302282 (13 worldwide citation)

An apparatus and method for synchronous communications using a serial data stream employs a housing with a controller and a back plane. The housing accepts one or more modules for interconnection with the back plane. The back plane distributes power to the modules and provides a communication link f ...


5
Christopher K Sutton, William R Pritchard, Kirsten C Carlson, James Martin: Electronic test system and method. Agilent Technologies, June L Bouscaren, January 4, 2005: US06839650 (12 worldwide citation)

An electronic test system having an object oriented hierarchical infrastructure including classes that allow a test developer or a test user to design a desired electronic test system. The class relationships define the function of the electronic test system. Classes include a procedure class, a tes ...


6
Ali Boudiaf, Vahe Adamian, Peter Phillips: Method and apparatus for performing multiport through-reflect-line calibration and measurement. Agilent Technologies, June L Bouscaren, February 8, 2005: US06853198 (11 worldwide citation)

A method and apparatus for calibrating a measurement path of 2N measurement ports comprises presenting a high reflect calibration standard at each measurement port and measuring a reflection characteristic for each measurement port, presenting a line calibration standard and a through calibration st ...


7
Vahe Adamian: Method and apparatus for measuring a device under test using an improved through-reflect-line measurement calibration. Agilent Technologies, June L Bouscaren, June 27, 2006: US07068049 (10 worldwide citation)

A method of measuring a DUT provides a vector network analyzer with at least two measurement ports and measures characteristics of thru, reflect, and line calibration standards at the measurement ports. Error coefficients are calculated as well as a shifted electrical length attributable to the meas ...


8
William S Burton: Apparatus for routing electrical signals. Agilent Technologies, June L Bouscaren, May 31, 2005: US06900533 (7 worldwide citation)

An apparatus for routing electrical signals is a layered structure having a signal trace connected to a via and to a conductive stub trace on a first side. A reference layer is on a second side of the layered structure. Removing a portion of the conductive reference layer in an area of the stub stra ...


9
Vahe′ A Adamian: Method, apparatus, and article of manufacture for characterizing a device and predicting electrical behavior of the device in a circuit. Agilent Technologies, June L Bouscaren, August 30, 2005: US06937032 (6 worldwide citation)

A method, apparatus and article of manufacture to aid in the characterization of a device establishes a device S-parameter matrix (SD) to represent electrical behavior of the device, an adapter T-parameter matrix (Ta) to represent all possible electrical paths through circuits to all device ports of ...


10
Ali Boudiaf, Vahe′ A Adamian: Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement. Agilent Technologies, June L Bouscaren, April 18, 2006: US07030625 (5 worldwide citation)

A method and apparatus for calibrating a multiport measurement path using through, high reflect and line calibration standards presents the through standard between no more than N−1 other pairs of measurement ports where at least one of the other pairs is a proximal pair.