31
Robert C Y Fang, Kuang Y Chiu: Defect free zero oxide encroachment process for semiconductor fabrication. Hewlett Packard Company, Jeffery B Fromm, Ronald E Grubman, August 16, 1983: US04398992 (21 worldwide citation)

A method for local oxideation of a semiconductor using only conventional large scale integration (LSI) fabrication techniques is provided which results in an oxide layer without the formation of the so-called "bird's beak" structure and no process or structure induced defects. On a semiconductor sub ...


32
James H Boyden: Apparatus for reducing erosion due to cavitation in ink jet printers. Hewlett Packard Company, Jeffery B Fromm, July 9, 1985: US04528574 (20 worldwide citation)

A novel structure which reduces stress due to cavitation in a thermal ink jet head is disclosed. A jetting resistor is formed on a thin membrane and suspended in contact with an acoustic absorber such as silicon oil on its back surface. The pressure wave created by the collapsing bubble which occurs ...


33
Peter U Guckenheimer: Keyboard switch assembly having sensory feedback. Hewlett Packard Company, Jeffery B Fromm, Cheryl L Shavers, February 19, 1985: US04500758 (18 worldwide citation)

A keyboard switch assembly is disclosed which utilizes a new switch design for providing tactile feedback to the user while nevertheless permitting long switch life. The keyboard switch assembly provides adjustable touch control to the user via a mechanical adjustment means while requiring minimal k ...


34
Hitoshi Noguchi, Tomoyuki Akiyama, Hideo Akama, Hideo Okara, Hisao Yoshino: Apparatus for measuring time variant device impedance. Hewlett Packard Company, Jeffery B Fromm, November 6, 1984: US04481464 (18 worldwide citation)

An apparatus is disclosed which can accurately measure time variant non-ideal device impedance without unwanted delays caused by internal filters. A novel scheme is used which reduces both noise and drift so that the measurement of time variant capacitance and conductance can be made with increased ...


35
Clifford B Cordy Jr: Charge transfer constant volt-second regulator. Hewlett Packard Company, Jeffery B Fromm, July 10, 1984: US04459539 (16 worldwide citation)

A voltage regulator circuit is disclosed which utilizes the stored charge on the intrinsic gate capacitance of a field effect transistor as the means to switch the power in a switch mode voltage regulator in conjunction with a constant volt-second regulator, where the stored charge is derived from t ...


36
Gregory L Ranson, Russell C Brockmann, Douglas B Hunt: Apparatus and method for comparing a group of binary fields with an expected pattern to generate match results. Hewlett Packard Company, Jeffery B Fromm, Guy J Kelley, Augustus W Winfield, March 23, 1999: US05887003 (14 worldwide citation)

Method for efficiently and flexibly comparing a group of multi-bit binary fields with a multi-bit expected pattern to generate a set of final match results, one final match result for each binary field in the group. Sets of of bit-wise comparator results are generated, one set for each binary field, ...


37
Gary Gordon, Kent Vincent: High pressure meter pump. Hewlett Packard Company, Jeffery B Fromm, July 8, 1986: US04599049 (14 worldwide citation)

A high pressure meter pump system with improved accuracy is provided by subdividing a large meter pump capacity into metered subvolume charges which are incrementally delivered to a high pressure slave pump.


38
Richard D Jolly: Method for making a self-aligned vertically stacked gate MOS device. Hewlett Packard Company, Jeffery B Fromm, Cheryl L Shavers, December 18, 1984: US04488348 (14 worldwide citation)

A method and structure for producing a vertically built MOS structure which permits the out diffusion of dopant from a layer of chemically deposited (CVD) doped oxide into a layer of CVD laser recrystallized polysilicon is disclosed. This out diffusion is accomplished during a high temperature oxida ...


39
Koichi Maeda, Haruo Ito: DC characteristics measuring system. Hewlett Packard Company, Jeffery B Fromm, August 21, 1984: US04467275 (14 worldwide citation)

A novel digitized measuring system is disclosed for the measurement of the DC parameters of a wide variety of electrical and electronic devices. A stimulus measuring unit (SMU) is disclosed which can alternatively act as a voltage source and current monitor or as a current source and voltage monitor ...


40
Wayne R Chism: Apparatus for the automatic in-circuit testing of subscriber line interface circuits and method therefor. Hewlett Packard Company, Jeffery B Fromm, August 22, 1989: US04860332 (14 worldwide citation)

An automated apparatus and method for in-circuit testing of a subscriber line interface circuit mounted on a telecommunications card. The automated apparatus is capable of testing the functioning of the subscriber line interface circuit: by applying analog voltage to the tip and ring pins and record ...