Robert C Y Fang, Kuang Y Chiu: Defect free zero oxide encroachment process for semiconductor fabrication. Hewlett Packard Company, Jeffery B Fromm, Ronald E Grubman, August 16, 1983: US04398992 (21 worldwide citation)

A method for local oxideation of a semiconductor using only conventional large scale integration (LSI) fabrication techniques is provided which results in an oxide layer without the formation of the so-called "bird's beak" structure and no process or structure induced defects. On a semiconductor sub ...

James H Boyden: Apparatus for reducing erosion due to cavitation in ink jet printers. Hewlett Packard Company, Jeffery B Fromm, July 9, 1985: US04528574 (20 worldwide citation)

A novel structure which reduces stress due to cavitation in a thermal ink jet head is disclosed. A jetting resistor is formed on a thin membrane and suspended in contact with an acoustic absorber such as silicon oil on its back surface. The pressure wave created by the collapsing bubble which occurs ...

Peter U Guckenheimer: Keyboard switch assembly having sensory feedback. Hewlett Packard Company, Jeffery B Fromm, Cheryl L Shavers, February 19, 1985: US04500758 (18 worldwide citation)

A keyboard switch assembly is disclosed which utilizes a new switch design for providing tactile feedback to the user while nevertheless permitting long switch life. The keyboard switch assembly provides adjustable touch control to the user via a mechanical adjustment means while requiring minimal k ...

Hitoshi Noguchi, Tomoyuki Akiyama, Hideo Akama, Hideo Okara, Hisao Yoshino: Apparatus for measuring time variant device impedance. Hewlett Packard Company, Jeffery B Fromm, November 6, 1984: US04481464 (18 worldwide citation)

An apparatus is disclosed which can accurately measure time variant non-ideal device impedance without unwanted delays caused by internal filters. A novel scheme is used which reduces both noise and drift so that the measurement of time variant capacitance and conductance can be made with increased ...

Clifford B Cordy Jr: Charge transfer constant volt-second regulator. Hewlett Packard Company, Jeffery B Fromm, July 10, 1984: US04459539 (16 worldwide citation)

A voltage regulator circuit is disclosed which utilizes the stored charge on the intrinsic gate capacitance of a field effect transistor as the means to switch the power in a switch mode voltage regulator in conjunction with a constant volt-second regulator, where the stored charge is derived from t ...

Gregory L Ranson, Russell C Brockmann, Douglas B Hunt: Apparatus and method for comparing a group of binary fields with an expected pattern to generate match results. Hewlett Packard Company, Jeffery B Fromm, Guy J Kelley, Augustus W Winfield, March 23, 1999: US05887003 (14 worldwide citation)

Method for efficiently and flexibly comparing a group of multi-bit binary fields with a multi-bit expected pattern to generate a set of final match results, one final match result for each binary field in the group. Sets of of bit-wise comparator results are generated, one set for each binary field, ...

Gary Gordon, Kent Vincent: High pressure meter pump. Hewlett Packard Company, Jeffery B Fromm, July 8, 1986: US04599049 (14 worldwide citation)

A high pressure meter pump system with improved accuracy is provided by subdividing a large meter pump capacity into metered subvolume charges which are incrementally delivered to a high pressure slave pump.

Richard D Jolly: Method for making a self-aligned vertically stacked gate MOS device. Hewlett Packard Company, Jeffery B Fromm, Cheryl L Shavers, December 18, 1984: US04488348 (14 worldwide citation)

A method and structure for producing a vertically built MOS structure which permits the out diffusion of dopant from a layer of chemically deposited (CVD) doped oxide into a layer of CVD laser recrystallized polysilicon is disclosed. This out diffusion is accomplished during a high temperature oxida ...

Koichi Maeda, Haruo Ito: DC characteristics measuring system. Hewlett Packard Company, Jeffery B Fromm, August 21, 1984: US04467275 (14 worldwide citation)

A novel digitized measuring system is disclosed for the measurement of the DC parameters of a wide variety of electrical and electronic devices. A stimulus measuring unit (SMU) is disclosed which can alternatively act as a voltage source and current monitor or as a current source and voltage monitor ...

Wayne R Chism: Apparatus for the automatic in-circuit testing of subscriber line interface circuits and method therefor. Hewlett Packard Company, Jeffery B Fromm, August 22, 1989: US04860332 (14 worldwide citation)

An automated apparatus and method for in-circuit testing of a subscriber line interface circuit mounted on a telecommunications card. The automated apparatus is capable of testing the functioning of the subscriber line interface circuit: by applying analog voltage to the tip and ring pins and record ...