1
Robert F Hartmann, Yiu Fai Chan, Robert Frankovich, Jung Hsing Ou: Programmable logic array device using EPROM technology. Altera Corporation, Hamrick Hoffman Guillot & Kazubowski, September 2, 1986: US04609986 (334 worldwide citation)

An electrically programmable, eraseable and reprogrammable, monolithic integrated circuit logic array device is disclosed. The device includes a plurality of three types of logic array macrocells, each including an AND array matrix of EPROM transistors configured to form a plurality of "product term ...


2
Robert F Hartmann, Sau Ching Wong, Yiu Fai Chan, Jung Hsing Ou: Programmable logic array device using EPROM technology. Altera Corporation, Hamrick Hoffman Guillot & Kazubowski, October 14, 1986: US04617479 (295 worldwide citation)

The programmable logic array device basically comprises a programmable AND array (FIGS. 5, 11) having a plurality of memory cells (30, 31) arranged in addressable rows (40-45) and columns (32-38) and which can be individually programmed to contain logic data; an input circuit (FIG. 9) for receiving ...


3
Paul Sandland, Kenneth Levy, Russell M Singleton, Michael L Hodgson, Gerald R Cutler: Electronic control of an automatic wafer inspection system. KLA Instruments Corporation, Hamrick Hoffman Guillot & Kazubowski, February 17, 1987: US04644172 (143 worldwide citation)

A system for automatic micro and macro inspection of patterned wafers, including a X-Y stage for supporting and positioning a wafer at a macro inspection station and a micro inspection station, a plurality of cassettes for storing a plurality of patterned wafers before and after inspection, a transf ...


4
Paul Sandland, Curt H Chadwick, Russell M Singleton, Howard Dwyer: Method and apparatus for automatic wafer inspection. KLA Instruments Corporation, Hamrick Hoffman Guillot & Kazubowski, October 21, 1986: US04618938 (139 worldwide citation)

An automatic semiconductor wafer inspection system including a wafer inspector, a system computer that performs movement and function control and data storage functions and a high speed image computer. Patterned wafers selected for inspection are automatically transported from cassette storage to a ...


5
Mark J Wihl: Automatic photomask inspection system having image enhancement means. KLA Instruments Corporation, Hamrick Hoffman Guillot & Kazubowski, December 30, 1986: US04633504 (108 worldwide citation)

Optical inspection apparatus for detecting defects in a visually perceptible pattern including image acquistion means for inspecting the pattern on a pixel-by-pixel basis, developing digital data signals corresponding to each pixel and feeding the signals so developed to an imaging enhancement means ...


6
David A Joseph, Peter G Eldredge: Automatic photomask inspection method and system. KLA Instruments Corporation, Hamrick Hoffman Guillot & Kazubowski, May 15, 1984: US04448532 (87 worldwide citation)

A method and apparatus for receiving two sets of digitized scan data from two optical detectors which simultaneously scan two supposedly identical portions of a photomask for comparing the two sets of scan data to detect defects, and for evaluating the defect data to determine whether or not it repr ...


7
Martin C Leung: Disposable diaper with isolated wetness indicator. Hamrick Hoffman Guillot & Kazubowski, March 26, 1985: US04507121 (68 worldwide citation)

Wetness indication means for disposable diapers are isolated from the skin of the wearer by unidirectional flow of liquid bodily excretions from absorbing layers of the diaper into an isolated pocket of absorbing materials through a zone containing the chemicals which indicate wetness by changing co ...


8
Norman C MacLeod: Apparatus and method for logging wells while drilling. MacLeod Laboratories, Hamrick Hoffman Guillot & Kazubowski, December 16, 1986: US04630243 (54 worldwide citation)

Measurement while drilling apparatus for detecting and communicating information relative to downhole parameters and/or characteristics of the earth strata via an electrically conductive drill string composed of a plurality of lengths of metallic pipe connected end-to-end in series and through which ...


9
Curt H Chadwick, Art M Shulenberger, John S Taylor, Richard R Simmons: Automatic focusing system for a microscope. KLA Instruments Corporation, Hamrick Hoffman Guillot & Kazubowski, January 27, 1987: US04639587 (49 worldwide citation)

An automatic microscope focusing system including a light source 44, a dual channel fiber optics bundle 56 and 58, chopper means 54 for alternately admitting light to the channels, a reticle 66 and associated optics to cast alternating images onto the surface of an inspected article W, return masks ...


10
Michael Wichinsky, LeRoy N Gutknecht: Coin projecting and target game apparatus. Hamrick Hoffman Guillot & Kazubowski, January 29, 1985: US04496160 (47 worldwide citation)

A game apparatus has a cabinet defining a playing area, a plurality of coin slots, and a rotable, ribbed, drum beneath the slots for projecting an accepted can within the playing area. In a lower portion of the playing area are two shelves onto which projected coins may fall, the shelves being trave ...