41
Janusz Wlodarczyk, Henry C Thompson, Thomas F Bernecki, Henry A Budke: Arc device with adjustable cathode. The Perkin Elmer Corporation, H S Ingham, F L Masselle, E T Grimes, November 29, 1988: US04788408 (29 worldwide citation)

An arc plasma generating system includes components for adjusting spacing between the cathode and the anode. A piston affixed to the cathode is slidingly positioned in a cylinder partitioning therein a first chamber and a second chamber. The first chamber is receptive of discharged cooling fluid at ...


42
Larry D Hartsough: Method and apparatus for attaching a target to the cathode of a sputtering system. The Perkin Elmer Corporation, Giarratana, F L Masselle, E T Grimes, May 27, 1980: US04204936 (29 worldwide citation)

An improved method and apparatus for attaching a target to the cathode of a cathode sputtering system is disclosed which includes a ferromagnetic retainer which releasably clamps the target to the cathode by virtue of its attraction to existing permanent magnets in the cathode assembly. An optional ...


43
John B Collins, Marc L Salit: Method of correcting spectral data for background. The Perkin Elmer Corporation, H S Ingham, E T Grimes, J R Wahl, March 1, 1994: US05291426 (28 worldwide citation)

A method of producing spectral data corrected for background includes generating spectral data, ascertaining background and subtracting background points to produce the corrected data. To ascertain background the spectral data are masked initially at the spectral peak of interest, and a least square ...


44
Thomas H Nash Jr, Celia P Chang, Anthony F Poile: Chromatographic instrument with command sequencing. The Perkin Elmer Corporation, H S Ingham, E T Grimes, November 13, 1990: US04969993 (28 worldwide citation)

A liquid chromatographic instrument includes specimen vessels in randomly designated locations. An automatic sampler sequentially samples specimens from selected vessels based on instructions from a set of command instruction lines. A detector module measures characteristics of each sampled specimen ...


45
Subramaniam Rangaswamy, Burton A Kushner, Roger Kaufold: Composite hard chromium compounds for thermal spraying. The Perkin Elmer Corporation, H S Ingham, F L Masselle, E T Grimes, February 16, 1988: US04725508 (27 worldwide citation)

A thermal spray material has been developed that includes a composite powder comprising chromium carbide or chromium boride and copper or copper alloy in the form of kernels of the chromium carbide or boride clad with the copper or copper alloy. Preferably the thermal spray material includes a self- ...


46
Charles J Williams: Method for detecting physical anomalies of U.S. currency. The Perkin Elmer Corporation, F L Masselle, E T Grimes, T P Murphy, February 7, 1984: US04429991 (27 worldwide citation)

Means and methods are provided for examining bills and detecting flaws therein, such as length and width variations, holes, tears and dog-ears or folded corners. Electrical signals are generated by light sensing circuits and compared with signals representing the standard physical characteristics of ...


47
David J Matthews: System for periodically reading all memory locations to detect errors. The Perkin Elmer Corporation, E T Grimes, J D Crane, July 30, 1985: US04532628 (26 worldwide citation)

A memory checking circuit for periodically reading the data from all locations therein. The circuit includes logic to correct and restore data from locations where an error has occurred. The circuit quickly identifies all memory locations present during search mode at a fast rate and reads all prese ...


48
Gary C Irons, John F Klein, Richard D Lander, Henry C Thompson, Richard D Trapani: Heavy duty plasma spray gun. Metco, F L Masselle, E T Grimes, J D Crane, April 24, 1984: US04445021 (26 worldwide citation)

A heavy duty plasma spray gun for extended industrial service is disclosed. The gun includes a gas distribution member made of a material having a coefficient of expansion different from that of the parts surrounding it. The gas distribution member is forcibly urged by a resilient member such as a c ...


49
Wayne E Kohman, Joseph E Maleri: Load-lock vacuum chamber. The Perkin Elmer Corporation, Giarratana, E T Grimes, T P Murphy, July 27, 1982: US04341582 (26 worldwide citation)

An apparatus for etching one wafer while simultaneously pretreating or stripping another wafer. A module comprises a wafer etching chamber disposed within a larger chamber. The wafer etching chamber is adapted to etch a first wafer during the time that a second wafer is being pretreated in the large ...


50
Edward T Siebert: Analyzer for coherent radiation. The Perkin Elmer Corporation, Giarratana, E T Grimes, T P Murphy, January 5, 1982: US04309108 (26 worldwide citation)

Apparatus for detecting and/or determining the wavelength of coherent radiation in the presence of incoherent ambient radiation. The apparatus includes at least three unequal path interferometers with the radiation path length difference in each interferometer being substantially greater than the co ...



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