James S McLean: Electric field generator incorporating a slow-wave structure. TDK Corporation, Kevin L Daffer, Daffer McDaniel, February 2, 2010: US07656167 (144 worldwide citation)

An improved E-field generator including a slow-wave transmission line structure is provided herein. In some cases, the improved E-field generator may include an inductively-loaded slow-wave transmission line structure driven by a power source at one end of the structure and terminated by a load at t ...

Rupaka Mahalingaiah: Method and apparatus for securing communication over public network. Dunti, Charles D Huston, Daffer McDaniel, June 4, 2013: US08458453 (143 worldwide citation)

A system and method of providing secure communications between two or more hosts connected to a public network, where a secure virtual network (SVN) is established among the two or more hosts.

Benjamin C E Schwarz, Kamel Ounadjela: Magnetic tunneling junction configuration and a method for making the same. Cypress Semiconductor, Kevin L Duffer, Mollie E Lettang, Daffer McDaniel, May 24, 2005: US06897532 (132 worldwide citation)

A method for forming a magnetic tunneling junction (MJT) is provided. In some embodiments, the method may include patterning one or more magnetic layers to form an upper portion of a MTJ. The method may further include patterning one or more additional layers to form a lower portion of the MTJ. In s ...

Richard S Schwerdtfeger, Lawrence F Weiss, Rabindranath Dutta: Electronic document delivery system employing distributed document object model (DOM) based transcoding and providing interactive javascript support. International Business Machines, Kevin L Daffer, Daffer McDaniel, Marilyn Dawkins IBM, May 30, 2006: US07054952 (106 worldwide citation)

Several different embodiments of an electronic document delivery system are described including a client machine (e.g., a palmtop/handheld computer or wireless communication device) coupled to a transcoder proxy. One embodiment of the system allows a client machine with limited resources to support ...

David J Knapp: Fault tolerant network utilizing bi-directional point-to-point communications links between nodes. SMSC Holding R L, Keven L Daffer, Daffer McDaniel, May 15, 2012: US08179787 (104 worldwide citation)

A data communication system and an associated network node implementation is disclosed that, in certain embodiments, uses single-channel bi-directional communication links between nodes to send frames of data. The network nodes can be connected together in a ring or daisy chain topology with data fr ...

Ramnath Venkatraman, Michael N Dillon, David A Gardner, Carl Anthony Monzel III, Subramanian Ramesh, Robert C Armstrong, Gary Scott Delp, Scott Allen Peterson: Basic cell architecture for structured application-specific integrated circuits. LSI Corporation, Daffer McDaniel, July 22, 2008: US07404154 (101 worldwide citation)

A basic cell circuit architecture having plurality of cells with fixed transistors configurable for the formation of logic devices and/or single/dual port memory devices within a structured ASIC is provided. Different configurations of ensuing integrated circuits are achieved by forming variable int ...

Christopher F Bevis, Mike Kirk, Mehdi Vaez Iravani: Systems for inspection of patterned or unpatterned wafers and other specimen. KLA Tencor Technologies, Ann Marie Mewherter, Daffer McDaniel, June 27, 2006: US07068363 (99 worldwide citation)

Systems for inspection of patterned and unpatterned wafers are provided. One system includes an illumination system configured to illuminate the specimen. The system also includes a collector configured to collect light scattered from the specimen. In addition, the system includes a segmented detect ...

Stan Stokowski, David Alles: Methods and systems for inspecting reticles using aerial imaging and die-to-database detection. KLA Tencor Technologies, Ann Marie Mewherter, Daffer McDaniel, October 17, 2006: US07123356 (73 worldwide citation)

Methods and systems for inspecting a reticle are provided. In an embodiment, a method may include forming an aerial image of the reticle using a set of exposure conditions. The reticle may include optical proximity correction (OPC) features. The method may also include detecting defects on the retic ...

Igor C Ivanov, Weiguo Zhang: Methods and system for processing a microelectronic topography. Blue29, Mollie E Lettang, Daffer McDaniel L, April 19, 2005: US06881437 (70 worldwide citation)

Methods and systems are provided which are adapted to process a microelectronic topography, particularly in association with an electroless deposition process. In general, the methods may include loading the topography into a chamber, closing the chamber to form an enclosed area, and supplying fluid ...

Suresh Lakkapragada, Kyle A Brown, Matt Hankinson, Ady Levy: Methods and systems for lithography process control. KLA Tencor Technologies, Ann Marie Mewherter, Daffer McDaniel, January 17, 2006: US06987572 (69 worldwide citation)

Methods and systems for evaluating and controlling a lithography process are provided. For example, a method for reducing within wafer variation of a critical metric of a lithography process may include measuring at least one property of a resist disposed upon a wafer during the lithography process. ...