1
Donald A Bradley, Martin I Grace, Douglas R Thornton, David P Finch: Apparatus and method for measuring the phase and magnitude of microwave signals. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, June 4, 1996: US05524281 (140 worldwide citation)

A measurement system is provided which comprises: source circuit for receiving feedback signals and for providing respective signals at respective discrete frequencies in a prescribed microwave frequency range, wherein the respective provided signals at respective discrete frequencies are substantia ...


2
Martin I Grace, Peter M Kapetanic, Eric C Liu: Method and apparatus for increasing the high frequency sensitivity response of a sampler frequency converter. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, May 12, 1992: US05113094 (100 worldwide citation)

A method and apparatus comprising a sampler frequency converter having a first and a second diode. A local oscillator having a frequency F.sub.LO, a step recovery diode and a balun transformer are used for providing positive and negative sampling pulses to the diodes for sampling an input signal app ...


3
William Oldfield: Apparatus for measuring and/or injecting high frequency signals in integrated systems. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, May 18, 1999: US05905421 (80 worldwide citation)

A device for measuring and/or injecting a high frequency signal, such as a 20 GHz signal from and/or into a system, is provided. The device includes a connector coupled to a coaxial cable at one end. A relatively small, low inductive rectangular member is coupled to the connector at the other end. A ...


4
John Poremba, Jack E Patterson: Fiber optic connection assembly. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, May 11, 1999: US05903698 (73 worldwide citation)

A connector assembly for optical fiber cables which provides an increased density of optical fiber connections in a confined space. The assembly includes a front panel defining a first plane; and a connection panel having a face defining a plane having an angle with respect to the first plane.


5
Ker Chin Chang, Clarence E Elkins, Paul A Marshall, Duane E Dunwoodie, Mohamed M Mansour, Paul R Bauer, Walter A Lobitz: Fault location operating system with loopback. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, April 23, 1991: US05010544 (40 worldwide citation)

A fault-location operating system for use with transmission networks using repeaters with loopback capabilities. A plurality of bidirectional transmission links L.sub.i, for i=1 through N, are used for transmission of data between the terminals. A test control unit is connected at the first terminal ...


6
Martin I Grace, William W Oldfield: Internal automatic calibrator for vector network analyzers. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, August 20, 1996: US05548538 (37 worldwide citation)

A calibration technique for a vector network analyzer (VNA) enabling calibration standards to be included internal to the VNA. To calibrate the VNA utilizing the internal calibration standards, error terms a, b and c of two two-port error boxes E are defined between the measurement ports and the ref ...


7
William W Oldfield: Microwave connector with an inner conductor that provides an axially resilient coaxial connection. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, November 19, 1996: US05576675 (22 worldwide citation)

An inner conductor for a high frequency microwave coaxial connector comprising a cylindrical conducting member with a central bore and slots that form fingers, and a cylindrical pressure contact member that is inserted in the cylindrical conducting member. The cylindrical pressure contact member has ...


8
William W Oldfield, Thomas R Brinkoetter, Todd D Antes: Automatic VNA calibration apparatus. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, December 24, 1996: US05587934 (21 worldwide citation)

An automatic VNA calibration apparatus is described which requires only a single connection at each of two test ports on a VNA and the pressing of one button. The apparatus comprises a housing for housing electrical components and a multi-throw switch which is controlled by a controller coupled to t ...


9
Martin I Grace, William W Oldfield: Internal automatic calibrator for vector network analyzers. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, February 3, 1998: US05715183 (19 worldwide citation)

A calibration technique for a vector network analyzer (VNA) enabling calibration standards to be included internal to the VNA. To calibrate the VNA utilizing the internal calibration standards, error terms a, b and c of two two-port error boxes E are defined between the measurement ports and the ref ...


10
Martin I Grace, Donald A Bradley, James N Liu: Measuring noise figure and y-factor. Wiltron Company, Fliesler Dubb Meyer & Lovejoy, March 2, 1993: US05191294 (16 worldwide citation)

Apparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise mo ...